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 Title: 逐步型一區間設限之韋伯壽命試驗抽樣設計;Sampling plans for the Weibull lifetime under progressive type I interval censorship Authors: 鄭士苹;Shi-ping Zheng Contributors: 統計研究所 Keywords: 成本函數;逐步型一區間設限;韋伯分布;cost function;progressive type I interval censoring;Weibull distribution Date: 2009-06-04 Issue Date: 2009-09-22 11:04:07 (UTC+8) Publisher: 國立中央大學圖書館 Abstract: 傳統的產品壽命試驗若屬於型一設限，則在試驗尚未停止之前不允許將未失效之產品移除。但是，實務上，試驗進行中不易達到連續監控所有產品物件運作而產生區間設限，並且在過程中必須將部份未失效之產品移除而產生逐步設限。因此，實務上產品壽命多見逐步型一區間設限。本文在逐步型一區間設限的壽命試驗之下，針對壽命服從韋伯分布的產品，根據給定生產者風險(型一誤差) 及消費者風險(型二誤差) 的平均壽命檢定，求出試驗成本達到最低時的最佳抽樣設計。 In the traditional type I censoring life tests, the survived experiment units are not allowed to remove. However, in practice, the experiment units may not be continuously inspected and some survived units are need to be removed due to some cause. In this thesis, we discuss how to obtain the test sampling plan for attaining the minimum cost under a progressive type I interval censored life tests when the lifetime of interest is distributed to Weibull and the test of mean lifetime is requested under some specific consumer's and product's risks. Appears in Collections: [統計研究所] 博碩士論文

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