全反射暨波長調變偏振干涉術之開發與折射率及厚度之量測應用;Development of Total-Internal-Reflection and Wavelength-Modulated Polarization Interferometry for Measurement of Refractive Index and Thickness.

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題名:	全反射暨波長調變偏振干涉術之開發與折射率及厚度之量測應用;Development of Total-Internal-Reflection and Wavelength-Modulated Polarization Interferometry for Measurement of Refractive Index and Thickness.
作者:	李朱育
貢獻者:	國立中央大學機械工程學系
關鍵詞:	射出成型;折射率;厚度;全反射;繞射光學元件;相位差極大值;波長調制;偏振干涉術;Injection molding;Refractive index;Thickness;Total internal reflection;Diffractive optical element;Maximum phase difference;Wavelength modulation;Polarization interferometry
日期:	2020-01-13
上傳時間:	2020-01-13 14:51:56 (UTC+8)
出版者:	科技部
摘要:	本計畫目的在開發「全場折射率與厚度分佈量測技術」，以解決當前檢測射出成型透鏡所面臨的問題。由於射出成型技術有生產效率高、以及塑膠材質重量輕等優點，因此射出成型透鏡便漸漸地取代了玻璃透鏡，廣泛地應用於各種領域，例如手機鏡頭，車用鏡頭及各類光學視訊鏡頭等。然而充填、保壓及冷卻等製程參數的變異會嚴重影響透鏡的光學參數，例如折射率與厚度分佈等。傳統的幾何式及干涉式的量測技術都無法同時量測這兩個參數，因為這兩個參數在光學上是耦合在一起的。這也是現今射出成型生產廠商所面臨的最大挑戰。本計畫將以「全反射之相位差極大值」原理為基礎，設計開發兩種創新的折射率分佈的量測技術，分別為「傾斜式相位量測系統」與「同軸式相位量測系統」，以解決透鏡曲率、形貌及厚度分佈對折射率量測的干擾問題。另一方面，針對透鏡厚度分佈量測的問題，將開發一種創新的「波長調變偏振干涉術」，以克服傳統光學干涉術受到折射率與厚度分佈相互耦合干擾的問題。本計畫規畫的工作項目擬於三年期間逐步完成，分別為(1)傾斜式相位量測系統設計開發，(2)同軸式相位量測系統設計開發，與(3)波長調變偏振干涉術設計開發。 ;This project aims at developing a "full-field refractive index and thickness distribution measurement technique" to solve the inspection problems of the injection molding lenses.Due to the high production efficiency of the injection molding technology and the light weight of the plastic material, the injection molding lens has gradually replaced the glass lens and is widely used in various fields, such as mobile phone lens, car lens and optical video lenses, etc. However, variations in manufacturing parameters such as filling, packing, and cooling can seriously affect the optical parameters of the lens, such as refractive index and thickness distribution. Because these two parameters are optically coupled together, the conventional geometric and interferometric measurement techniques can’t measure both them at the same time. This is the biggest challenge facing injection molding manufacturers today.To solve the coupling problem of refractive index, curvature shape and thickness, based on the principle of the "maximum phase difference in total-internal reflection", this project will design and develop two innovative measurement techniques for the refractive index distribution. They are "Tilted phase measurement system" and "Coaxial phase measurement system". Regarding to the measurement of lens thickness distribution, an innovative "wavelength modulation polarization interferometry" will be developed to overcome the problem that conventional optical interferometry is interfered by the mutual coupling of refractive index and thickness distrubtion. The project is planned to be completed step by step in three years, namely design and development of (1) tilted phase measurement system, (2) coaxial phase measurement system, and (3) wavelength modulation polarization interferometry.
關聯:	財團法人國家實驗研究院科技政策研究與資訊中心
顯示於類別:	[機械工程學系] 研究計畫

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