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    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/91166


    Title: 結合結構式基態耗乏之掃描式雙光子結構照明顯微術;Scanning Two-Photon Structured Illumination Microscopy Based on Structured Ground State Depletion
    Authors: 陳思妤
    Contributors: 國立中央大學光電科學與工程學系
    Keywords: 超解析度;結構照明顯微術;基態耗乏;雙光子螢光;光學切片;superresolution;structured illumination microscopy;ground state depletion;two-photon fluorescence;optical sectioning
    Date: 2024-01-26
    Issue Date: 2024-09-18 14:17:46 (UTC+8)
    Publisher: 科技部
    Abstract: 現有之結構照明系統皆難免受到散射螢光訊號的影響而有所限制,本計畫首度提出能有效避免散射螢光訊號之架構,除了在學術上之重要性外,亦能提升結構照明系統在厚組織或活體內之解析度及穿透度,有助於在生醫研究上提供更多寶貴的資訊,若能進一步應用至臨床上,將能提升臨床診斷的準確性,對國人健康的提升亦能有所貢獻。
    Relation: 財團法人國家實驗研究院科技政策研究與資訊中心
    Appears in Collections:[Department of Optics and Photonics] Research Project

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