本論文主要研究全像片在高強度環境下的收縮情況。根據全像片繞射公式，由於收縮，全像片在記錄時的參考光角度會與最佳讀取角度有差異以及參考光波長和最佳讀取波長會有差異。基於這兩點特性，本文採用兩種不同的方法測量收縮情況，從而獲得全像片在長時間高壓環境下的收縮量及其光學特性變化。此外，本文還在已知的收縮極限情況下，通過模擬高度收縮後的全像片，預測其光學特性，使其表現如同預期的光學特性。;This paper primarily investigates the shrinkage of holograms in high-intensity environments. According to the hologram diffraction formula, due to shrinkage, there will be differences between the reference light angle during recording and the optimal reading angle, as well as differences between the reference light wavelength and the optimal reading wavelength. Based on these two characteristics, this paper employs two different methods to measure the shrinkage, thereby obtaining the shrinkage amount and optical characteristics of the hologram under long-term high-pressure environments. Additionally, under known extreme shrinkage conditions, this paper simulates highly shrunk holograms to predict their optical characteristics, making them exhibit the expected optical properties.
