光學 Moiré 投影技術在故障辨識中的應用;Application of Optical Moiré Projection Technology in Fault Detection

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題名:	光學 Moiré 投影技術在故障辨識中的應用;Application of Optical Moiré Projection Technology in Fault Detection
作者:	施俊谷;Shih, Jyun-Gu
貢獻者:	光電科學與工程學系
關鍵詞:	故障檢測;疊紋;Moire
日期:	2025-07-25
上傳時間:	2025-10-17 11:47:12 (UTC+8)
出版者:	國立中央大學
摘要:	在當今高度依賴電子產品與音訊設備的社會中，喇叭作為聲音輸出的關鍵元件，其品質直接影響使用者的聽覺體驗與產品整體價值。無論是在智慧型手機、耳機、車用音響，或是家庭劇院系統中，喇叭的表現品質都是消費者評價產品優劣的主要依據之一。隨著工廠大量生產的需求日益增加，如何在不犧牲效率的前提下，確保每一顆喇叭都達到穩定且高品質的標準，將成為製造業面臨的重要挑戰。目前許多工廠仍然使用人工檢查或者接觸式的儀器來進行喇叭的品質控管。然而，這些方法不僅在效率與一致性上存在缺陷，對於某些細微結構問題（如振膜偏心、變形或微裂紋）也無法即時並準確地辨識。如此，一種快速、準確、非接觸式的檢測技術顯得格外迫切。本論文將探討光學 Moiré 投影技術在喇叭故障偵測中的應用潛力，並分析其在實務生產中是否能提供一個更有效率且可自動化的檢測解決方案，以因應現今產線對高品質與高效率的雙重需求，根據實驗結果顯示，表面不平整的故障會使Moiré條紋觀測系統整體的量測結果振幅提升，並且在Moiré旋轉角度越大時，4個量測點的精準度會越高。 ;In today′s society, which heavily relies on electronic products and audio equipment, speakers serve as a critical component for sound output. Their quality directly impacts the auditory experience of users and the overall value of a product. Whether in smartphones, headphones, car audio systems, or home theater setups, speaker performance is a key factor influencing consumer evaluations of product quality. As the demand for mass production increases, ensuring that every speaker consistently meets high-quality standards without compromising manufacturing efficiency has become a major challenge for the industry. Currently, many factories still rely on manual inspection or contact-based instruments for quality control of speakers. However, these methods have limitations in terms of efficiency and consistency. Moreover, they often fail to accurately detect subtle structural issues such as diaphragm misalignment, deformation, or micro-cracks. This highlights the urgent need for a fast, accurate, and non-contact inspection technology. This paper explores the application potential of optical Moiré projection technology in speaker fault detection and analyzes whether it can serve as a more efficient and automated inspection solution for modern manufacturing lines. According to experimental results, surface irregularities in defective units cause an increase in amplitude in the Moiré pattern measurement system. Furthermore, as the Moiré rotation angle increases, the precision of the four measurement points also improves.
顯示於類別:	[光電科學研究所] 博碩士論文

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