| 摘要: | 鑑於癌症的發生率逐年上升，據行政院衛生福利部國民健康署台灣女性十大癌症排序指出，女性罹患乳癌的發生率為所有癌症之首、死亡率也僅次於肺癌高居第二名，因此乳癌有效診斷成為現今極重要研究課題。90年代發展近紅外光擴散光學斷層掃描(Near-infrared Diffuse Optical Tomography, NIR-DOT)系統運用組織在近紅外光下光學特性差異來判別正常和腫瘤組織進而增加篩檢率，實驗室同樣在近些年來致力發展這項技術。
不同波長的近紅外光在人體組織內，其光學特性不同，在實驗驗證會調製仿體作模擬，因此仿體調製光學係數準確性影響驗證結果。本研究分別重新啟用∅300mm雙積分球與單進單出掃描平台檢驗實驗室先前建立波長830nm仿體調製公式，用波長830nm分別對標準光學仿體量測，完成雙積分球與單進單出掃描平台軟硬體之間系統校正。經校正兩系統個別量測由調配公式所作盤狀與薄片仿體各6個計算光學係數進而判斷誤差與是否需修改公式；最後運用比爾朗伯架構量測及單進單出掃描平台量測7個仿體來建立波長785nm仿體調配公式。系統架構包括元件特性測試、實驗流程設計及系統因子分析等。
根據量測結果得知，調製指定光學係數仿體在波長830nm下經雙積分球與單進單出掃描平台量測計算後發現結果6組有5組接近目標光學係數，誤差大多於20%以內，有些許樣本因製作問題導致散射係數差異達到30%，進而推論實驗室雷射波長830nm仿體調配公式是具有一定準確性。建立785nm調配公式發現散射係數過高會提高計算誤差，體現反算程式在不討論極端值清況下是準確的。
;Given the increasing incidence of cancer each year, according to the ranking of the top ten cancers among Taiwanese women published by the Health Promotion Administration, Ministry of Health and Welfare, breast cancer has the highest incidence among all cancers in women and ranks second in mortality, just after lung cancer. Therefore, effective diagnosis of breast cancer has become a critically important research topic today.
Since the 1990s, Near-Infrared Diffuse Optical Tomography (NIR-DOT) systems have been developed to utilize the differences in optical properties of tissues under near-infrared light to distinguish between normal and tumor tissues, thereby increasing screening rates. Our laboratory has also been dedicated to developing this technology in recent years.
Different wavelengths of near-infrared light exhibit varying optical properties in human tissue, and phantom models are often prepared to simulate these properties for experimental verification. Thus, the accuracy of the optical coefficients used in phantom preparation significantly affects the validity of the experimental results.
In this study, a previously established 830 nm wavelength phantom preparation formula by the laboratory was re-evaluated using both a ∅300 mm double integrating sphere and. 1S-1D scanning device. Standard optical phantoms were measured at 830 nm, enabling system calibration between the software and hardware of the two systems.
After calibration, both systems measured six disk-shaped and six thin-sheet phantoms prepared using the formula. The optical coefficients were calculated to assess measurement errors and determine whether the formula required modification. Finally, seven phantoms were measured using a Beer-Lambert law-based setup and the 1S-1D scanning device to establish a phantom preparation formula for the 785 nm wavelength. The system architecture included component characterization, experimental workflow design, and system factor analysis.
Based on the measurement results, five out of six phantoms prepared with target optical coefficients at 830 nm showed values close to the intended coefficients when measured using both the double integrating sphere and 1S-1D scanning device, with most errors within 20%. Some samples exhibited differences in scattering coefficients up to 30% due to fabrication issues, suggesting that the laboratory′s 830 nm phantom preparation formula possesses a reasonable degree of accuracy. During the development of the 785 nm formula, it was found that overly high scattering coefficients led to increased computational errors, demonstrating that the inverse calculation program is accurate under non-extreme conditions. |
