A study on the lot production management in a thin-film-transistor liquid-crystal display fab

NCUIR > School of Management at National Central University > Graduate Institute of Industrial Management > journal & Dissertation > Item 987654321/99980

Please use this identifier to cite or link to this item: https://ir.lib.ncu.edu.tw/handle/987654321/99980

Title:	A study on the lot production management in a thin-film-transistor liquid-crystal display fab
Authors:	何應欽;Ho, Ying-Chin;Lin, Jian-Wei;Liu, Hao-Cheng;Yih, Yuehwern
Contributors:	管理學院工業管理研究所
Keywords:	AGV;Lot production management;Lot selection;Photo bay selection
Date:	2016-07-01
Issue Date:	2026-04-21 13:43:41 (UTC+8)
Publisher:	Elsevier;Elsevier Ltd
Abstract:	摘要： •Three problems that can affect the lot production in a TFT-LCD fab are studied.•The first two problems are the lot selection problems of AGVs and machines.•The third problem is the photo bay selection of lots.•A fuzzy dynamic bidding method and an earliest possible time method are proposed.•Results show the proposed methods outperform those used by the case company. Because of their higher processing priority, hot lots often interrupt the production of regular lots in a Thin-Film-Transistor Liquid-Crystal Display (TFT-LCD) fab. As a result, how to manage the production of hot lots so that their production demand can be met and their negative effects on regular lots minimized is a very important issue. In this paper, we identity three problems – the lot selection of interbay AGVs, the lot selection of intrabay machines, and the photo bay selection of lots – that can affect the production of hot lots and regular lots and propose methods for them. A fuzzy-based dynamic bidding (FBDB) method is proposed for the first two problems. The bidding functions in this FBDB method consider several attributes of the current system to obtain the true values of bids. An earliest possible time (EPT) method that also considers several attributes of the current system is proposed for the third problem. These two methods are compared with methods used by a Taiwanese TFT-LCD fab through computer simulations. The effects of hot lot ratios on the performance of these methods are also analyzed. Six performance measures are adopted to measure the throughput and tardiness performance of all lots, regular lots and hot lots. The simulation results show applying the FBDB and EPT methods to the three problems studied here can result in very good results in all performance measures. 出版者： Elsevier Ltd 出版日期： 2016-07-01 出處： Journal of manufacturing systems, 2016-07, Vol.40, p.9-25 資源來源： Elsevier ScienceDirect Journals Complete 版權： 2016 The Society of Manufacturing Engineers 識別號： ISSN: 0278-6125 識別號： EISSN: 1878-6642 識別號： DOI: 10.1016/j.jmsy.2016.03.002
Appears in Collections:	[Graduate Institute of Industrial Management] journal & Dissertation

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