摘要： The reduction dynamics of micron-sized defects created on chemical vapor deposition- (CVD) grown graphene through scanning probe lithography (SPL) is reported here. CVD-grown graphene was locally oxidized using SPL and subsequently reduced, making use of a focused beam of soft x-rays. During this whole process, the reduction dynamics was monitored using a combination of micro-Raman spectroscopy ( -RS) and micro-x-ray photoelectron spectroscopy ( -XPS). After x-ray reduction, the graphene film was found to be chemically identical ( -XPS) but structurally different ( -RS) from the original graphene. During reduction the population of C-C bonds was found to first increase dramatically and then decrease exponentially. By modeling the dynamics of the C=O → C-O → C-C → C=C reduction process with four coupled-rate equations and three rate constants, the conversion from C-C to C=C bonds was found to be the limiting rate. 其他題名： TDM 其他題名： 2D Mater 出版者： IOP Publishing 出版日期： 2015-08-06 出處： 2d materials, 2015-08, Vol.2 (3), p.31003 資源來源： Institute of Physics Journals 版權： 2015 IOP Publishing Ltd 識別號： ISSN: 2053-1583 識別號： EISSN: 2053-1583 識別號： DOI: 10.1088/2053-1583/2/3/031003
