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    請使用永久網址來引用或連結此文件: https://ir.lib.ncu.edu.tw/handle/987654321/105672


    題名: A comparison of normal approximation rules for attribute control charts
    作者: 江村剛志;Emura, Takeshi;Lin, Yi-Shuan
    貢獻者: 理學院統計研究所
    關鍵詞: Approximation;attribute control chart;binomial distribution;Binomials;Control charts;Defects;Loans;Mathematical analysis;np-chart;p-chart;Semiconductors;Statistical methods;statistical process control
    日期: 2015-04-01
    上傳時間: 2026-04-23 12:46:58 (UTC+8)
    出版者: John Wiley and Sons Ltd;Bognor Regis: Blackwell Publishing Ltd
    摘要: 摘要: Control charts, known for more than 80 years, have been important tools for business and industrial manufactures. Among many different types of control charts, the attribute control chart (np‐chart or p‐chart) is one of the most popular methods to monitor the number of observed defects in products, such as semiconductor chips, automobile engines, and loan applications. The attribute control chart requires that the sample size n is sufficiently large and the defect rate p is not too small so that the normal approximation to the binomial works well. Some rules for the required values for n and p are available in the textbooks of quality control and mathematical statistics. However, these rules are considerably different, and hence, it is less clear which rule is most appropriate in practical applications. In this paper, we perform a comparison of five frequently used rules for n and p required for the normal approximation to the binomial. With this result, we also refine the existing rules to develop a new rule that has a reliable performance. Datasets are analyzed for illustration. Copyright © 2013 John Wiley & Sons, Ltd.
    其他題名: Qual. Reliab. Engng. Int
    出版者: Bognor Regis: Blackwell Publishing Ltd
    出版日期: 2015-04
    出處: Quality and Reliability Engineering International, 2015-04, Vol.31 (3), p.411-418
    資源來源: Wiley Online Library - AutoHoldings Journals
    版權: Copyright © 2013 John Wiley & Sons, Ltd.
    版權: Copyright © 2015 John Wiley & Sons, Ltd.
    識別號: ISSN: 0748-8017
    識別號: EISSN: 1099-1638
    識別號: DOI: 10.1002/qre.1601
    識別號: CODEN: QREIE5
    顯示於類別:[統計研究所] 期刊論文

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