Institute of Electrical and Electronics Engineers Inc.;New York: IEEE
摘要:
摘要： In this paper, we consider a multiple Type-I censored life test of series systems in which each component's lifetime belongs to the log-location-scale family of distributions with dependence. The dependence among lifetimes of components is generated by the Clayton copula with unknown copula parameter. We obtain the maximum likelihood estimates of the underlying parameters via EM algorithm under masked data and derive the Fisher information via missing information principle. The effect due to misspecification by independent models is investigated through the percentiles estimation of both the system's and components' failure time distributions by simulation study as well as a real data example. 其他題名： TR 出版者： New York: IEEE 出版日期： 2016-06-01 出處： IEEE Transactions on Reliability, 2016-06, Vol.65 (2), p.1069-1080 資源來源： IEEE Electronic Library (IEL) 版權： Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2016 識別號： ISSN: 0018-9529 識別號： EISSN: 1558-1721 識別號： DOI: 10.1109/TR.2016.2515589 識別號： CODEN: IERQAD
