Institute of Electrical and Electronics Engineers Inc.;IEEE
摘要:
摘要： In a series system, the system fails if any of the components fails. When the system functions, there may exist correlation among components because they are connected within the same system. In this paper, we consider the reliability analysis of multiple Type-I censored life tests of series systems composed of two components with bivariate log-normal lifetime distributions. The major interest is the inference on the mean lifetimes, and the reliability functions of the system and its components. Given observations of the minimum lifetime of the components of each failed system, location of the MLEs highly relies on the initial values in executing the computation numerically. Alternatively, we apply the Bayesian approach after a re-parametrization of the parameters of interest. A simulation study is conducted which shows that the Bayesian approach provides considerably accurate inference. The proposed approach is successfully applied to a real data set. 其他題名： TR 出版者： IEEE 出版日期： 2015-03-01 出處： IEEE transactions on reliability, 2015-03, Vol.64 (1), p.376-385 資源來源： IEEE Electronic Library (IEL) 識別號： ISSN: 0018-9529 識別號： EISSN: 1558-1721 識別號： DOI: 10.1109/TR.2014.2337813 識別號： CODEN: IERQAD
