Testing ternary content addressable memories with comparison faults using march-like tests

NCUIR > College of Electrical Engineering & Computer Science > Graduate Institute of Electrical Engineering > journal & Dissertation > Item 987654321/32124

Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/32124

Title:	Testing ternary content addressable memories with comparison faults using march-like tests
Authors:	Li,Jin-Fu
Contributors:	電機工程研究所
Keywords:	METHODOLOGIES;ARCHITECTURE
Date:	2007
Issue Date:	2010-07-06 18:19:08 (UTC+8)
Publisher:	中央大學
Abstract:	Ternary content addressable memory (TCAM) plays an important role in various applications for its fast lookup operation. This paper proposes several comparison fault models (i.e., the faults cause Compare operation fail) of TCAMs based on electrical defec
Relation:	IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
Appears in Collections:	[Graduate Institute of Electrical Engineering] journal & Dissertation

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