先進電離層雙生儀地面電子測試設備;Electrical Ground Segment Equipment for Dual Advanced Ionospheric Probe

NCUIR > College of Earth Sciences > Graduate Institute of Space Science > Department of Earth Sciences > Item 987654321/68132

Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/68132

Title:	先進電離層雙生儀地面電子測試設備;Electrical Ground Segment Equipment for Dual Advanced Ionospheric Probe
Authors:	陳立恆;Chen,Li-Heng
Contributors:	太空科學研究所
Keywords:	先進電離層雙生儀;DAIP
Date:	2015-07-13
Issue Date:	2015-09-23 10:47:09 (UTC+8)
Publisher:	國立中央大學
Abstract:	先進電離層雙生儀 ( Dual Advance Ionospheric Probe, DAIP )地面電子測試設備( Electrical Ground Segment Equipment ) 主要沿自於過去開發電離層電漿量測的科學任務所開發的先期測試與驗證裝置。早期是由福爾摩沙衛星五號先進電離層探測儀( Advanced Ionospheric Probe, AIP) 的酬載模擬器 ( Instrument Simulation Device ) 開始， -隨後根據科學酬載的配置與需求， -發展出科學酬載電子系統(Science Payload Electronics Unit, SPEU) 模擬器和指令與資料管理裝置( Command and Data Management Unit ) 模擬器。本論文所發展是預備未來可能將放在福爾摩沙衛星七號第二星群DAIP所需的地面電子測試設備，其酬載將過去的SPEU濃縮成新式探測器內的數位控制單元，並取代原先探測器內的傳輸介面，同時考量新式探測器訊號串接的可能。並將針對新式探測器施行模擬測試，完整地測試探測器的功能和傳輸資料的驗證。此外，也將深入的探討未來所需要加強的內容。;A new Electrical Ground segment Equipment (EGSE) is designed for development and test on Duel Advanced Ionospheric Probe (DAIP) anticipated to install on the second cluster of FORMOSAT-7 satellite. The DAIP is a next generation of Advanced Ionospheric Probe (AIP) to pack Science Payload Electronics Unit (SPEU) inside sensor head. The EGSE has a heritage of an Instrument Simulation Device, a SPEU simulator, and a Command and Data Management Unit (CDMU) simulator of the Formosat-5 AIP. In this thesis, a test procedure is performed with the EGSE and a DAIP prototype. It is essentially helpful to discover some bugs of the DAIP prototype in the future development.
Appears in Collections:	[Graduate Institute of Space Science] Department of Earth Sciences

Files in This Item:

File	Description	Size	Format
index.html		0Kb	HTML	434	View/Open

社群 sharing

Loading...