我在這個實驗中的目標是在單電子盒（SEB）上進行電子隧穿事件(tunneling event)。 SEB由兩層鋁和一個絕緣屏層組成。當施加閘極電壓時，每個單電子都會隧穿SEB的能量障礙(barrier)。將SEB的閘極電壓施加到島周圍以操縱電荷配置。它必須在低溫下工作。 SEB中的電子隧穿事件由單電子晶體管（SET）進行測量。在測量結果中，我相信電子隧穿事件是經由過SEB接面(junction)的能量障礙發生的。我看到許多與SEB接面上的電子隧穿事件有關的信號。由於時間限制，我僅測量SEB上罕見的電子隧穿事件。根據研究，無法將實驗作完善是因為SEB的電阻在大氣壓下隨時間而變高。另一個原因是電子隧穿速度更快，這也為本次實驗困難之處: 不穩定的製程以及來自儀器所線之採樣速度不夠。;My goal in this experiment is electron tunneling event on the single-electron box (SEB). The SEB consists of two layers of aluminum and an insulating barrier. Every single-electron will tunnel through the barrier of the SEB when the gate voltage is applied. The gate voltage of the box is applied to around the island to manipulate charge configuration. It works at low-temperature. The electron tunneling event in the SEB is inspected by a single-electron transistor (SET). In the measurement result, I believe that the electrons tunneling event occurs through the barrier of SEB junction. I see many signals related to the electron tunneling event on the SEB junction. Because of time-limited, I only measure electrons tunneling event that is rare on the SEB. According to studies, it happened because the resistance on the SEB becomes higher along time at under atmospheric pressure. Another reason is electrons tunneling is faster.
