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姓名	蔡政憲(Cheng-hsien Tsai)  查詢紙本館藏	畢業系所	電機工程學系在職專班
論文名稱	低成本類比數位轉換器自動測試機台研究 (The Study on Low Cost Automatic Test Equipment (ATE) Implement in Analog to Digital Convertor (ADC) Test Solution)
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摘要(中)	回顧台灣半導體產業發展史自引進積體電路(Integrated Circuit, IC)封裝測試技術(Assembly and Test)迄今已有40年歷史，在政府有計畫的輔導、推動以及業界多年的經營，從上游晶圓材料到IC設計業、製造業、封裝業、測試業等，產業結構可謂相當完整，產值與成長率都有十分顯著的成績。 近年來IC的功能日趨複雜且強大，速度上由1970年代的百萬赫茲(MHz)頻率到現在的幾十億赫茲(GHz)頻率，因此產品測試已是十分重要。從產品開發週期，測試成本(Cost of Test, COT)也日趨高漲。為了符合測試需求，IC產品性能的提升使業界對自動測試機台(Automatic Test Equipment, ATE)的性能也越來越講究，相對投資更高的COT。 在上述的背景下，本論文主在研究如何降低COT且增加成品測試(Final Test)，本篇論文架構將包含下列方向： 1. 低COT ATE軟硬體(Software and Hardware)結構研究 2. 研究測試產能(Productivity)提升、效率改善以降低測試成本 3. 類比轉換數位器(Analog to Digital Convertor, ADC)線性度測試學理之創新〝雙碼關係(Relationship Between a Pair of Codes, RBPC)〞及測試程式的實現。 本文目的在於研究低COT技術應用在ATE測試流程以改善測試效率、提升測試品質以及產能提升建立低測試成本環境。
摘要(英)	While reviewing the history of Taiwan’’s semiconductor industry, the assembly and test technology of integrated circuit (IC) had been introduced to Taiwan for 40 years. Due to the government’s great support and lots of companies invested funds and human resource on the semiconductor industry over years, Taiwan has well developed the matured semiconductor technology including wafer process manufacturing, IC design, assembly and test infra-structure. Where the industrial structure is quite complete and their output value and growth rate are very significant. The functions of IC become increasingly complex and powerful recently. In 1970s, from the operation frequency at megahertz (MHz) to gigahertz (GHz), therefore the IC product testing becomes important. From the product development cycle, testing costs (Cost of Test, COT) are becoming increasingly high. In order to meet the testing demand, due to IC product performance complexity and precision, then we require Automatic Test Equipment (ATE) with higher specifications relative to the investment of high COT. The purpose of this paper is a test methodology to reduce the COT and increases the capacity of the final test (FT) production. The thesis contains the following section: (1) Structure of the low COT ATE hardware and software (2) Research of the testing capacity (productivity) enhancement and improve efficiency to reduce COT. (3) Analog converter Digital’s (ADC’s) linearity innovation test based on "relationship between the pair of codes, RBPC" and its test program.
關鍵字(中)	★ 半導體元件測試 ★ 線性度	關鍵字(英)	★ Linearity ★ IC test
論文目次	目 錄 摘要 I Abstract II 誌 謝 IV 目 錄 V 圖目錄 VII 表目錄 XI 第一章 緒論 1 1-1 研究動機 1 1-2 測試產業介紹及其重要性 2 1-2-1 ADC重要參數規格 5 1-3 研究成果 11 1-4 章節簡述 11 第二章 Teradyne A580、VLC-ATE測試系統 13 2-1 A580測試系統介紹 13 2-2 A580測試流程架構 29 2-3 VLC-ATE測試系統介紹 31 2-4 VLC-ATE測試流程架構 46 2-5測試機台特性比較 50 2-6 FastADC模組介紹 51 第三章 觸碰掃描系統晶片介紹及問題描述 54 3-1 TSC2003產品簡介及量產介紹 54 3-2 ADC類比數位轉換器測試原理所遭遇之問題描述及分析 64 3-2-1問題分析 64 3-2-2線性直方統計圖法 68 3-2-3品質試驗 71 第四章 雙碼關係應用於ADC線性度測試 75 4-1 簡介 75 4-2 雙碼關係 76 4-3 實驗及量測結果 78 4-4 理論應用 82 4-5 結果討論 84 第五章 結論 85 5-1 結論 85 5-2 未來期許與研究方向 86 附錄 87 參考文獻 100
參考文獻	參考文獻 [1] 蘇亮綱,”利用TEST SPC提升測試設備綜合效率及使用率(OEE)/(OEU)”，國立台灣科技大學工業管理系EMBA碩士論文. [2] “An Introduction to Mixed-Signal IC Test and Measurement”,Chap12,Mark Burns and Gordon W. Roberts, ISBN: 0-19-514016-8, p469~p470. [3] International Technology Roadmap for Semiconductors, 2009 Edition, http://public.itrs.net/. [4] 李紹輝,”混合訊號系統單晶片電性測試之標準化測試介面語言研究,”義守大學電子工程學系碩士論文. [5] “An Introduction to Mixed-Signal IC Test and Measurement”,Chap12,Mark Burns and Gordon W. Roberts, ISBN: 0-19-514016-8, p456~p462. [6] 蘇亮綱,”利用TEST SPC提升測試設備綜合效率及使用率(OEE)/(OEU)”，國立台灣科技大學工業管理系EMBA碩士論文, , p29~p30. [7] Teradyne A580 Instrumentation Online Manual, Chapter 13 Percision Low Frequency Source, p13-4. [8] Teradyne A580 Instrumentation Online Manual, Chapter 13 Percision Low Frequency Source, p13-6. [9] Teradyne A580 Instrumentation Online Manual, Chapter 13 Percision Low Frequency Source, p13-5. [10] Teradyne A580 Instrumentation Online Manual, Chapter 26 Digital Signal Capture, p26-4. [11] Teradyne A580 Instrumentation Online Manual, Chapter 26 Digital Signal Capture, p26-5. [12] Teradyne A580 Instrumentation Online Manual, Chapter 26 Digital Signal Capture, p26-7. [13] Teradyne A580 Instrumentation Online Manual, Chapter 26 Digital Signal Capture, p26-8. [14] Teradyne A580 Instrumentation Online Manual, Chapter 26 Digital Signal Capture, p26-10. [15] Teradyne A580 Instrumentation Online Manual, Chapter 26 Digital Signal Capture, p26-13. [16] Teradyne A580 Instrumentation Online Manual, Chapter 26 Digital Signal Capture, p26-12. [17] Teradyne A580 Instrumentation Online Manual, Chapter 26 Digital Signal Capture, p26-13. [18] Teradyne A580 Instrumentation Online Manual, Chapter 26 Digital Signal Capture, p26-17. [19] Texas Instruments VLC-ATE Hardware Overview Manual, Chapter 1-14 VLC-ATE Octal UPMU Board, p1-33. [20] Texas Instruments VLC-ATE Production Test Systems, Chapter 3.2.2 VLC-ATE Analog Channels, p3-28. [21] Texas Instruments VLC-ATE Hardware Overview Manual, Chapter 1.6.2 VI Power and Sense, p1-43. [22] Texas Instruments VLC-ATE Hardware Overview Manual, Chapter 1.6.2 VI Power and Sense, p1-44. [23] Texas Instruments VLC-ATE Hardware Overview Manual, Chapter 1.6.3 DUT Voltage Measurement – Kelvin Connections, p1-45. [24] Texas Instruments VLC-ATE Hardware Overview Manual, Chapter 1.6.4 Differential Volmeters, p1-47. [25] Texas Instruments VLC-ATE Hardware Overview Manual, Chapter 1.6.4 Differential Volmeters, p1-48. [26] Texas Instruments VLC-ATE Hardware Overview Manual, Chapter 1.6.5 Vref, p1-50. [27] Texas Instruments VLC-ATE Hardware Overview Manual, Chapter 1.6.5 Vref, p1-51. [28] Texas Instruments VLC-ATE Production Test Systems, Chapter 3.3 VLC-ATE Functional Test & Digital Pins, p3-46. [29] Texas Instruments VLC-ATE Production Test Systems, Chapter 9.2 Fast ADC Test, p9-4. [30] Texas Instruments VLC-ATE Programming Guide, Chapter 6.15 Fast ADC Test Statement, p6-199. [31] " TSC2003 I2C TOUCH SCREEN CONTROLLER,"Texas Instrument Inc., p1. [32] " TSC2003 I2C TOUCH SCREEN CONTROLLER,"Texas Instrument Inc., p1. [33] Successive Approximation ADC的基本架構, http:// audi.nchu.edu.tw/.../Successive%20approximation%20ADC.doc [34] " TSC2003 I2C TOUCH SCREEN CONTROLLER,"Texas Instrument Inc., p10. [35] " TSC2003 I2C TOUCH SCREEN CONTROLLER,"Texas Instrument Inc., p17. [36] " TSC2003 I2C TOUCH SCREEN CONTROLLER,"Texas Instrument Inc., p17. [37] " TSC2003 I2C TOUCH SCREEN CONTROLLER,"Texas Instrument Inc., p17.
指導教授	邱煥凱(Hwann-kaeo Chiou)	審核日期	2012-7-20
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