博碩士論文 993203006 詳細資訊




以作者查詢圖書館館藏 以作者查詢臺灣博碩士 以作者查詢全國書目 勘誤回報 、線上人數:36 、訪客IP:18.191.97.229
姓名 黃健全(Chien-chuan Huang)  查詢紙本館藏   畢業系所 機械工程學系
論文名稱 以反應式磁控濺鍍製備Ag2O/TiO2疊層薄膜及其特性之研究
相關論文
★ 凝膠濃度對胎盤幹細胞貼附及分化之影響★ 摻雜銀或銀銅氮氧化鉭薄膜之製備、特性分析及抗菌行為分析
★ 以射頻磁控濺鍍法製備銦鋅氧化物(IZO)透明導電薄膜並探討製程參數對其薄膜之影響★ 以微陽極導引電鍍法沉積奈米氧化鋅薄膜
★ 在一些氣候因素的預測和相關性的一些經濟和農業指標★ Fabrication and Characterization of Polymethylmethacrylate (PMMA) Thin Film by Plasma Polymerization
★ Effects of Diluted Ar in H2/SiH4 on Amorphous Hydrogenated Silicon Thin Film (i-layer) by an Inductive Coupled Plasma-Chemical Vapor Deposition (ICP-CVD) System★ 評估貝里斯Rio Bravo保育管理區內硬木種類之樹高
★ 以HFSS 天線模擬程式為設計LTE Band 41設計天線★ The Deposition and Microstructure of Tungsten Oxide Films by Physical Vapor Deposition
★ 以塊狀金屬玻璃和其複材製作骨科鑽頭及其鑽孔能力之研究★ Economic feasibility for recycling crystalline silicon photovoltaics modules
★ 電漿聚合系統在不同功率下製成聚吡咯薄膜之特性及微結構分析★ Structural Study on BaCeO3 Perovskite Thin Film by Sputtering
★ 用於表面電漿共振光譜的多層金鋁薄膜的設計與優化★ 磁控濺射法製備氧氮化釩薄膜的製備和表徵
檔案 [Endnote RIS 格式]    [Bibtex 格式]    [相關文章]   [文章引用]   [完整記錄]   [館藏目錄]   至系統瀏覽論文 ( 永不開放)
摘要(中) 當兩個不同的氧化物薄膜疊層時,假如吸收層(上層)的導帶與價帶位置都比下層的氧化物薄膜還要低的話,受光激發的跳至導帶的電子會往下層薄膜的導帶去被捕捉,進而產生儲能的效果。最近的研究中有提出Cu2O/TiO2疊層薄膜就有此效果。為了研究此現象,我們使用反應式磁控濺鍍法沉積Ag2O/TiO2之疊層薄膜於玻璃基板上。分別的厚度為200nm及300nm。使用XRD、UV-Vis 分光光譜儀、光致螢光光譜儀及光電化學測試分別測試薄膜的結構、光學性質以及光電化學性質。UV-Vis光譜表現出了薄膜的吸收性質以及能隙。疊層薄膜與單層的Ag2O薄膜比較,在可見光激發後疊層薄膜的吸收特性在可見光區域有上升的情況。從光致螢光光譜中我們可以發現可見光可以有效的激發Ag2O層。光電化學實驗中得到的薄膜光電流,疊層之後的Ag2O/TiO2薄膜比單層的Ag2O及TiO2都有更大的光電流,並且使用光電流來計算光電轉換效率。我們可以從這些結果來確認Ag2O/TiO2疊層薄膜的儲能效果。
摘要(英) When two different oxides films stacked together, if the absorption (upper) layer has both its conduction and valence bands levels more negatively lower than that of the layer underneath, then the photo-excited electrons can be forwarded to the underneath layer to become an effect of energy storage. Recent studies discovered that the double layers of Cu2O/TiO2 films possess such capacity. In order to investigate this specific phenomenon, we use a DC magnetron reactive sputtering to deposit a double-layer of Ag2O/TiO2 films on glass substrate. The film thicknesses of the double-layer are 300nm and 200nm respectively. XRD, UV-VIS photospectrometer, photoluminance test and photoelectrochemical test were used to study the structure, optical absorption, band gaps and photocurrents of the stacked films. From XRD, we can confirm the structure of each layer. When compared to the single film of Ag2O, the stacked Ag2O/TiO2 film was found to have enhanced optical absorption under the irradiation of visible light. The PL spectrum revealed that the Ag2O layer can be excited by visible light. The photocurrent of Ag2O/TiO2 film was higher than Ag2O and TiO2 single layer. The IPCE of films was calculated by photocurrents, too. The energy storage of Ag2O/TiO2 film can confirm by these results.
關鍵字(中) ★ 反應式磁控濺鍍
★ Ag2O
★ Ti3+
★ 儲能
關鍵字(英)
論文目次 中文摘要 ……………………………………………………………… i
英文摘要 ……………………………………………………………… ii
致謝 ……………………………………………………………… iii
目錄 ……………………………………………………………… iv
圖目錄 ……………………………………………………………… v
表目錄 ……………………………………………………………… vii
一、 文獻回顧…………………………………………………… 1
1-1 TiO2薄膜及其儲能機制…………………………………… 1
1-2 Ti3+性質介紹………………………………………………… 3
1-3 Ag2O材料介紹……………………………………………… 4
1-4 實驗動機與目的…………………………………………… 5
二、 實驗與設備………………………………………………… 6
2-1 實驗架構…………………………………………………… 6
2-2 製程設備…………………………………………………… 7
2-2-1 濺鍍原理與反應式濺鍍…………………………………… 7
2-2-2 濺鍍系統簡介……………………………………………… 7
2-2-3 濺鍍步驟與實驗參數……………………………………… 8
2-3 薄膜結構分析與量測儀器………………………………… 10
2-3-1 表面輪廓量測儀…………………………………………… 10
2-3-2 X光繞射儀………………………………………………… 11
2-4 薄膜光學性質分析儀器…………………………………… 11
2-4-1 紫外光可見光分光光譜儀………………………………… 11
2-4-2 光致螢光光譜儀…………………………………………… 12
2-5 光電化學測試分析儀器…………………………………… 13
三、 實驗結果與討論…………………………………………… 15
3-1 薄膜性質分析……………………………………………… 15
3-1-1 薄膜X光繞射分析………………………………………… 15
3-1-2 薄膜光學性質分析………………………………………… 16
3-1-3 薄膜光致螢光光譜分析…………………………………… 20
3-2 薄膜光電化學測試分析…………………………………… 23
3-2-1 動態電位掃描……………………………………………… 23
3-2-2 定電位測試………………………………………………… 24
結論 ……………………………………………………………… 27
參考文獻 ……………………………………………………………… 28
參考文獻 1. S. Kment, P. Kluson, Z. Hubicka, J. Krysa, M. Cada, I. Gregora, A. Deyneka, Z. Remes, H. Zabova, L. Jastrabik , Electrochimica Acta 55 (2010) 1548–1556.
2. L. Xiong , J. Li And Y. Yu , Energies 2 (2009) , 1009-1030
3. F. Fang , Q. Li, J.K. Shang, Surface & Coatings Technology 205 (2011) 2919–2923
4. F. Willig, C. Zimmermann , S. Ramakrishna , W. Storck, Electrochimica Acta 45 (2000) 4565–4575.
5. W. Zhou, H. Liu, J. Wang, D. Liu, G. Du, S. Han, J. Lin And R. Wang, Phys. Chem. Chem. Phys,12 (2010) 15119–15123.
6. K. Thamaphat, P. Limsuwan, B. Ngotawornchai, K.J. Nat. Sci. 42 (2008) 357–361.
7. L. Xiong, M. Ouyang, L.Yan, J. Li, M.Qiu,And Y. Yu, Chemistry Letters 38(12) (2009) 1154-1155.
8. P.-G.Wu, C.-H. Ma, J.K. Shang, Appl. Phys. A81 (2005) 1411–1417.
9. J.F. Piersona, D. Wiederkehr, A. Billard,Thin Solid Film 478 (2005) 196–205.
10. H. Tang, K. Prasad, R. Sanjinbs, P. E. Schmid, and F. Lévy, J. Appl. Phys. 75(4) (1994) 2042-2047.
11. K. Obata, H. Irie, K. Hashimoto, Chem. Phys. 339 (2007) 124–132.
12. P.-G.Wu, C.-H. Ma, J.K. Shang, Appl. Phys. A 81(2005), 1411–1417.
13. T. Umebayashi, T. Yamaki, H. Itoh, K. Asai, Appl. Phys. Lett. 81(3) (2002), 454-456.
14. J. M. Jung, M. Wang, E. J. Kim, S. H. Hahn, Vacuum 82 (2008) 827–832
15. L. Xiong M. Ouyang, L. Yan, J. Li, M. Qiu, Y. YuChem. Lett. 38(12) (2009) 1154-1155.
16. Y. You, L. Wan, S. Zhang, D. Xu, Mater. Res. Bull. 45 (2010) 1850–1854.
17. K. Thamaphat1, P. Limsuwan, B. Ngotawornchai, Kasetsart J. (Nat. Sci.) 42 (2008), 357–361.
18. N.S. Anwar, A. Kassim, H.N. Lim, S.A. Zakarya, N.M. Huang, Sains Malaysiana 39(2)(2010), 261–265.
19. J. F. Piersona, D. Wiederkehr, A. Billard, Thin Solid Film 478 (2005) 196– 205.
20. M. Rafiq, H. Siddiqui, S. Alshehri, I. Kh. Warad, N. M. Abd El-Salam, R. M. Mahfouz, Int J Mol Sci. 2010; 11(9), 3600–3609.
21. Guang-Li Wang, Jing-Juan Xu, Hong-Yuan Chen, Shou-Zhong Fu, Biosenseor and Bioelectronics. 25 (2009)791-796
22. D. A. Kudryashov, S. N. Grushevskaya, And A. V. Vvedenskii, Prot. Met., 43(6), (2007) 591–599.
23. F. Fang , Q. Li, J.K. Shang, Surf. Coat. Technol. 205 (2011) 2919–2923.
24. T-H Lin, T-T Chen, C-L Cheng, H-Y Lin, Y-F Chen, Optic. Exp. 17(6) (2009)4342-4347.
25. X-Y Gao., F. Liang, M. Mina, Z. Yuan, L. Xiaoa, Y-S Chen, E. Yangshi, G.Hua, Phys. B 405 (2010) 1922–1926.
26. Gunnar Schön, Acta Chem. Scand. 27 (1973) 2623-2633.
27. Liang-Bin Xiong, Jia-Lin Li, Bo Yang, and Ying Yu, Journal of Nanomaterials No.83152 (2012)
28. GAO Xiao-Yong, LIU Xu-Wei, WANG Song-You, CHIN.PHYS.LETT vol.25 No.4 (2008) 1449
29. Ullash Kumar Barik, S.Srinivasan, C.L.Nagendra, A.Subrahmanyam, Thin Solid Films 429 (2003) 129–134
30. J, Tauc, R. Grigorovici, A. Vancu, Phys. Status Solidi, 15 (1966) 627-637.
31. J. Tauc, Mater. Res. Bull., 3 (1968) 37-46.
32. H. Tang, K. Prasad, R. Sanjines, P.E. Schmid, F. Levy, J. Appl. Phys., 75 (1994) 2042-2047.
33. M. M. Rahman, K. M. Krishna, T. Soga, T. Jimba, M. Umeno, J. Phys. Chem. Solid., 60 (1999) 201.
34. P. Sharma, M. Vashistha, I. P. Jain, J. Optoelect. Adv. Mater., 7(5) (2005) 2647-2654.
35. J. Yu, J. Xiong, B. Cheng, S. Liu, Appl. Catal. B, 60 (2005) 211–221.
指導教授 李泉 審核日期 2013-1-18
推文 facebook   plurk   twitter   funp   google   live   udn   HD   myshare   reddit   netvibes   friend   youpush   delicious   baidu   
網路書籤 Google bookmarks   del.icio.us   hemidemi   myshare   

若有論文相關問題,請聯絡國立中央大學圖書館推廣服務組 TEL:(03)422-7151轉57407,或E-mail聯絡  - 隱私權政策聲明