DC 欄位 |
值 |
語言 |
DC.contributor | 機械工程學系 | zh_TW |
DC.creator | 張哲偉 | zh_TW |
DC.creator | Che-Wei Chang | en_US |
dc.date.accessioned | 2017-7-19T07:39:07Z | |
dc.date.available | 2017-7-19T07:39:07Z | |
dc.date.issued | 2017 | |
dc.identifier.uri | http://ir.lib.ncu.edu.tw:444/thesis/view_etd.asp?URN=104323085 | |
dc.contributor.department | 機械工程學系 | zh_TW |
DC.description | 國立中央大學 | zh_TW |
DC.description | National Central University | en_US |
dc.description.abstract | 工業界對放電加工的需求逐年增加,主要是因為放電加工可有效解決對於高硬度、耐熱性等不易加工材料的加工問題,但放電加工會帶來加工表面缺陷及表面品質不佳之問題,工業界至今仍無法找到有效的方法解決。
前人研究發現在放電加工液處於特定濁度的情況下加工後有較佳的表面粗糙度,因此本文探討設計一封閉迴路,利用光學式濁度感測器及自製的循環過濾系統結合Arduino控制板配合圖控軟體 LabVIEW 實現即時濁度監測與控制,期望藉由控制加工液濁度,以達到改善放電加工表面粗糙度的目標。 | zh_TW |
dc.description.abstract | The demand for Electric Discharge Machining(EDM) is increasing year by year in the industry. Because of EDM can effectively solve the problem of processing materials such as high hardness and heat resistance. However, EDM will bring about defects in surface defects and poor surface quality that still can not find an effective way to solve in the industry.
Previous studies have found that processing will get a better surface roughness when the EDM fluid in a specific turbidity. Therefore, in this paper, we design a closed loop system that use of optical turbidity sensor and a cycle filtration system combined with Arduino microcontroller and LabVIEW to realize Real-time turbidity monitoring and control. Expected to achieve the goal of improving the surface roughness in EDM by controlling the turbidity of the EDM fluid. | en_US |
DC.subject | 放電加工 | zh_TW |
DC.subject | 濁度控制 | zh_TW |
DC.subject | 濁度監控 | zh_TW |
DC.subject | 表面粗糙度 | zh_TW |
DC.subject | Electric Discharge Machining(EDM) | en_US |
DC.subject | Turbidity control | en_US |
DC.subject | Turbidity monitoring | en_US |
DC.subject | Surface roughness | en_US |
DC.title | 放電加工液濁度控制之研究 | zh_TW |
dc.language.iso | zh-TW | zh-TW |
DC.type | 博碩士論文 | zh_TW |
DC.type | thesis | en_US |
DC.publisher | National Central University | en_US |