dc.description.abstract | This thesis focuses on the establishment, calibration and measurement of one-snap multi-angle spectroscopy optical system, the system consists of an objective lens, an afocal system, an optical slit, a grating and a Complementary Metal-Oxide-Semiconductor (CMOS) chip, the objective lens is used to collect different angles of light into the system, pass through spatially filter, separates the wavelength and match the beam size. Finally, we can obtain spatial spectrum of two dimensions which are wavelength and angle.
The light intensity distribution is distorted since the system is affected by the response of the optical element, so we calibrate system intensity by optical fiber.
The calibrating matrix of electroluminescence follows the previous research results, in this thesis the red and green OLEDs are used to check the correctness of the calibrating matrix. Photoluminescence is difficult to define the area of illumination, it is necessary to calibrate its light intensity again. The calibration method is also calibrated by fiber, and using orange light material verification of the correctness of the photoluminescence calibrating matrix. The reflectance measurement is a measure of relative intensity, this system uses a silver mirror as the reflectivity reference. Using the system to capture two-dimensional spectrum of the silver mirror and the sample, separately. Spectrum of the sample divided by spectrum of the silver mirror is the reflectance of sample.
One-snap multi-angle spectroscopy optical system have many advantages over fiber. In addition to quickly obtaining the spatial spectrum of the planar light source, the system can measure the reflectance at a zero angle or the photoluminescence spectrum at a low angle. The above advantages are more difficult to achieve under general fiber measurement. Finally, this paper proposes that this system can be used to measure the angle resolved components and OLEDs measurement. | en_US |