博碩士論文 110226086 完整後設資料紀錄

DC 欄位 語言
DC.contributor光電科學與工程學系zh_TW
DC.creator莊嘉程zh_TW
DC.creatorChia-Cheng Chuangen_US
dc.date.accessioned2024-8-13T07:39:07Z
dc.date.available2024-8-13T07:39:07Z
dc.date.issued2024
dc.identifier.urihttp://ir.lib.ncu.edu.tw:444/thesis/view_etd.asp?URN=110226086
dc.contributor.department光電科學與工程學系zh_TW
DC.description國立中央大學zh_TW
DC.descriptionNational Central Universityen_US
dc.description.abstract本論文主要研究全像片在高強度環境下的收縮情況。根據全像片繞射公式,由於收縮,全像片在記錄時的參考光角度會與最佳讀取角度有差異以及參考光波長和最佳讀取波長會有差異。基於這兩點特性,本文採用兩種不同的方法測量收縮情況,從而獲得全像片在長時間高壓環境下的收縮量及其光學特性變化。此外,本文還在已知的收縮極限情況下,通過模擬高度收縮後的全像片,預測其光學特性,使其表現如同預期的光學特性。zh_TW
dc.description.abstractThis paper primarily investigates the shrinkage of holograms in high-intensity environments. According to the hologram diffraction formula, due to shrinkage, there will be differences between the reference light angle during recording and the optimal reading angle, as well as differences between the reference light wavelength and the optimal reading wavelength. Based on these two characteristics, this paper employs two different methods to measure the shrinkage, thereby obtaining the shrinkage amount and optical characteristics of the hologram under long-term high-pressure environments. Additionally, under known extreme shrinkage conditions, this paper simulates highly shrunk holograms to predict their optical characteristics, making them exhibit the expected optical properties.en_US
DC.subject光電zh_TW
DC.subject全像zh_TW
DC.subject收縮zh_TW
DC.subject布拉格繞射zh_TW
DC.subject體積全像zh_TW
DC.subjectMR眼鏡zh_TW
DC.title全像片收縮模型zh_TW
dc.language.isozh-TWzh-TW
DC.titleHolograms shrinkage modelen_US
DC.type博碩士論文zh_TW
DC.typethesisen_US
DC.publisherNational Central Universityen_US

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