| DC 欄位 |
值 |
語言 |
| DC.contributor | 光電科學與工程學系 | zh_TW |
| DC.creator | 李淇合 | zh_TW |
| DC.creator | CHI-HO,LEE | en_US |
| dc.date.accessioned | 2025-1-22T07:39:07Z | |
| dc.date.available | 2025-1-22T07:39:07Z | |
| dc.date.issued | 2025 | |
| dc.identifier.uri | http://ir.lib.ncu.edu.tw:444/thesis/view_etd.asp?URN=112226034 | |
| dc.contributor.department | 光電科學與工程學系 | zh_TW |
| DC.description | 國立中央大學 | zh_TW |
| DC.description | National Central University | en_US |
| dc.description.abstract | 本研究針對體積全像光學元件(Volume Holographic Optical Element, VHOE)的品質檢測提出了一套新方法。透過設計與記錄體積全像光柵，結合光學繞射斷層掃描(Optical Diffraction Tomography, ODT)技術，實現了 VHOE 相位分布的準確量測及折射率分布重建。在有嚴格控制雜訊的研究結果表示，製程時間的長短對繞射效率的影響不大，但對體積全像光柵品質的影響是極大的。
本研究針對VHOE提出了有效的可視化雜訊分析方法，系統性地探討這些問題對全像光柵品質的影響，並據此提出製程優化建議。結果表明，透過控制製成環境與參數，可以顯著改善 VHOE 的折射率結構穩定性與光學性能。本方法為高品質 VHOE 的設計與應用提供了實用的分析工具與理論依據，對體積全像光學元件製造領域具有重要的參考價值。 | zh_TW |
| dc.description.abstract | This study proposes a novel method for quality inspection of Volume Holographic Optical Elements (VHOEs). By designing and recording volume holographic gratings combined with Optical Diffraction Tomography (ODT) technology, accurate measurement of the phase distribution and reconstruction of the refractive index distribution of VHOEs were achieved. Under strict noise control, the results indicate that the duration of the fabrication process has little effect on diffraction efficiency but significantly impacts the quality of the volume holographic grating.
This study introduces an effective visualization-based noise analysis method for VHOEs, systematically exploring the impact of these issues on grating quality and providing process optimization recommendations accordingly. The results demonstrate that by controlling the manufacturing environment and parameters, the refractive index structure stability and optical performance of VHOEs can be significantly improved. This method offers a practical analytical tool and theoretical basis for the design and application of high-quality VHOEs, providing valuable reference significance for the field of volume holographic optical element manufacturing. | en_US |
| DC.subject | 折射率分佈量測 | zh_TW |
| DC.subject | 體積全像光學元件 | zh_TW |
| DC.subject | 光學繞射斷層掃描 | zh_TW |
| DC.subject | Refractive index distribution measurement | en_US |
| DC.subject | Volume Holographic Optical Elements | en_US |
| DC.subject | Optical Diffraction Tomography | en_US |
| DC.title | 體積全像光學元件的折射率分布量測 | zh_TW |
| dc.language.iso | zh-TW | zh-TW |
| DC.title | Refractive Index Distribution Measurement of Volume Holographic Optical Elements | en_US |
| DC.type | 博碩士論文 | zh_TW |
| DC.type | thesis | en_US |
| DC.publisher | National Central University | en_US |