DC 欄位 |
值 |
語言 |
DC.contributor | 電機工程學系 | zh_TW |
DC.creator | 劉文雄 | zh_TW |
DC.creator | Wen-Hsiung Liu | en_US |
dc.date.accessioned | 2002-6-24T07:39:07Z | |
dc.date.available | 2002-6-24T07:39:07Z | |
dc.date.issued | 2002 | |
dc.identifier.uri | http://ir.lib.ncu.edu.tw:444/thesis/view_etd.asp?URN=89521025 | |
dc.contributor.department | 電機工程學系 | zh_TW |
DC.description | 國立中央大學 | zh_TW |
DC.description | National Central University | en_US |
dc.description.abstract | 本研究探討的主題是在n-型矽晶圓上研製具有隔離氧化層的非晶碳化矽氫(a-SiC:H)、非晶氮化矽氫(a-SiN:H) 和電壓調色的非晶碳(氮)化矽氫[a-SiC(N):H]等n-i-p薄膜發光二極體,並量測及分析其光電特性。這些元件在n層及p層區域均分別採用組成摻雜梯度能隙(composition-dopant-graded gap)結構,以增加載子注入效率,提升元件的發光亮度、降低元件的操作電壓。在元件製程方面,利用在陰極附加不銹鋼濾網的電漿助長化學氣相沈積(PECVD)系統,以減少薄膜在沈積時遭電漿轟擊所造成的傷害,故可獲得品質較佳的非晶薄膜,並以最佳化退火製程,改善薄膜發光二極體的光電特性。所完成的非晶碳化矽氫(a-SiC:H) n-i-p 薄膜發光二極體的元件發光亮度在電流密度等於600 mA/cm2時為8100 cd/m2,發光臨限電壓值為19.1 V,電激發光(EL)頻譜峰值波長為600 nm,。而另一非晶氮化矽氫(a-SiN:H) n-i-p薄膜發光二極體的電激發光(EL)頻譜峰值波長為528 nm,發光臨限電壓值為15.4 V,,元件發光亮度在電流密度等於300 mA/cm2時為370 cd/m2。而電壓調色的非晶碳(氮)化矽氫[a-SiC(N):H] 薄膜發光二極體,在不同的偏壓下,電激發光(EL)頻譜峰值波長會在565 nm與670 nm間移動。 | zh_TW |
dc.description.abstract | In order to investigate the feasibility of fabricating Si-based visible light-emitting diodes (LEDs) with common well-developed silicon processing technology, the SiO2-isolated n [phosphorous-doped hydrogenated amorphous silicon (n-a-Si:H) ] - i [intrinsic hydrogenated amorphous silicon-carbon (i-a-SiC:H) or intrinsic hydrogenated amorphous silicon-nitride (i-a-SiN:H)] - p [boron-doped hydrogenated amorphous silicon (p-a-Si:H)] thin-film LEDs (TFLEDs) were fabricated on n-type c-Si wafers. These SiO2-isolated TFLEDs would emit red-orange, green-white light and even light with voltage-tunable color.
The red-orange TFLED revealed a highest brightness of 8100 cd/m2 at an injection current density of 600 mA/cm2, an electroluminescence (EL) peak wavelength at 600 nm, and an EL threshold voltage = 19.1 V. The green-white TFLED had a brightness of 370 cd/m2 at an injection current density of 300 mA/cm2, an EL peak wavelength at 528 nm, and an EL threshold voltage = 15.4 V. The voltage-tunable TFLEDs had the EL peak wavelength ranged from 565 nm to 670 nm at different applied voltages.
The experimental results demonstrated the feasibility of developing Si-based visible light-emitting devices on c-Si substrate. | en_US |
DC.subject | 薄膜發光二極體 | zh_TW |
DC.subject | 非晶質 | zh_TW |
DC.subject | 矽晶圓 | zh_TW |
DC.subject | 氧化隔離層 | zh_TW |
DC.subject | TFLEDs | en_US |
DC.subject | c-Si | en_US |
DC.subject | SiO2-Isolated | en_US |
DC.subject | Amorphous | en_US |
DC.subject | a-SiC:H | en_US |
DC.subject | a-SiN:H | en_US |
DC.title | 矽晶圓上具有隔離氧化層非晶質薄膜發光二極體之光電特性 | zh_TW |
dc.language.iso | zh-TW | zh-TW |
DC.title | Optoelectronic Characteristics of SiO2-Isolated Amorphous TFLEDs on c-Si Wafer | en_US |
DC.type | 博碩士論文 | zh_TW |
DC.type | thesis | en_US |
DC.publisher | National Central University | en_US |