DC 欄位 |
值 |
語言 |
DC.contributor | 光電科學與工程學系 | zh_TW |
DC.creator | 蘇暐凱 | zh_TW |
DC.creator | Wei-kai Su | en_US |
dc.date.accessioned | 2008-7-21T07:39:07Z | |
dc.date.available | 2008-7-21T07:39:07Z | |
dc.date.issued | 2008 | |
dc.identifier.uri | http://ir.lib.ncu.edu.tw:444/thesis/view_etd.asp?URN=952206032 | |
dc.contributor.department | 光電科學與工程學系 | zh_TW |
DC.description | 國立中央大學 | zh_TW |
DC.description | National Central University | en_US |
dc.description.abstract | 本篇論文利用輻射理論及非序列光線追跡軟體來進行光學編碼器的光學特性分析。藉由輻射理論建立數學模組來進行數值積分求取解析解,在與光線追跡軟體的結果做比對。再由實驗來證實數學模組數值積分解與光線追跡結果的正確性。利用RMSE分析法計算出實驗結果與數值積分解的RMSE為0.00168, 証實我們利用輻射理論建立之數學模組的精確性。我們也作了光學編碼器之敏感度分析,我們發現編碼條紋的寬度p是最敏感的,而轉盤與光罩間的距離d的影響次之。
最後,本論文亦提出一種新的決定定址的編碼方法,這種方法可以適用於任何一種個光學編碼器。 | zh_TW |
dc.description.abstract | This paper employs the radiometry and non-sequential ray tracing simulation to analyze the optical properties of optical rotary encoders. Use the numerical integration solution based on radiometry and the ray tracing simulation result to do curve fitting. Then we verify our numerical integration solution and ray tracing simulation result by the experiment result. By the RMSE (root mean square) analysis, the RMSE of experimental result and simulation result is 0.00171, and the RMSE of experimental result and numerical solution is 0.00168. We also optimize the sensitivity analysis of ORE, and we find that the effect of variance of width of the code fringe p is most significant. The effect of distance between the disc and the mask d is secondary.
Finally, This paper present a novel absolute addressing method for ORE, and this method also can be employed to other kings of encoder. | en_US |
DC.subject | 光學編碼器 | zh_TW |
DC.subject | 旋轉編碼器 | zh_TW |
DC.subject | optical encoder | en_US |
DC.subject | rotary encoder | en_US |
DC.title | 高解析度光學旋轉編碼器之研究 | zh_TW |
dc.language.iso | zh-TW | zh-TW |
DC.title | Research of high resolution optical rotary encoder | en_US |
DC.type | 博碩士論文 | zh_TW |
DC.type | thesis | en_US |
DC.publisher | National Central University | en_US |