博碩士論文 952206035 完整後設資料紀錄

DC 欄位 語言
DC.contributor光電科學與工程學系zh_TW
DC.creator楊仕勤zh_TW
DC.creatorShih-Chin Yangen_US
dc.date.accessioned2008-7-17T07:39:07Z
dc.date.available2008-7-17T07:39:07Z
dc.date.issued2008
dc.identifier.urihttp://ir.lib.ncu.edu.tw:444/thesis/view_etd.asp?URN=952206035
dc.contributor.department光電科學與工程學系zh_TW
DC.description國立中央大學zh_TW
DC.descriptionNational Central Universityen_US
dc.description.abstract本論文是以電子鎗蒸鍍系統來製鍍氧化鎂薄膜,研究製鍍參數對氧化鎂薄膜的影響,其中包括薄膜的光學特性、結晶形態、水氣吸收及微觀結構。 光學特性方面,在較大陽極電壓的離子助鍍下,氧化鎂薄膜有最大的折射率;結晶特性方面,高溫下製鍍出來的氧化鎂薄膜,其結晶性越好,而退火處理更能進一步的增進氧化鎂薄膜的結晶強度;水氣吸收方面,除當離子助鍍時有較緻密的膜質外,在所有製程中均發現了少量的水氣吸收;表面粗糙度在本實驗中,發現當陽極電壓越大時,表面粗糙度越小,另外在高溫退火也有降低表面粗糙度的效果。zh_TW
dc.description.abstractThe study of magnesium oxide optical thin film by using electron beam evaporation system for protective films was investigated in this thesis. The crystalline properties and optical stability including refractive index, surface roughness, were determined from deposition parameter. Besides, annealing process and evaporation with ion assisted deposition also affect the crystalline properties and optical stability. When the anode voltage is higher, the magnesium oxide optical thin film annexed the best refractive index. The higher substrate temperature will improve the crystalline intensity. Annealing process will also boost the crystalline intensity more extended. Because of the moisture absorption, thin films will not acquire good qualities other than using ion assisted. In our investigation, we found that when the anode voltages increased, the thin film surface roughness was decreased. Besides, the annealing process has the same to reduce the surface roughness as well.en_US
DC.subject氧化鎂zh_TW
DC.subject保護膜zh_TW
DC.subject退火處理zh_TW
DC.subject離子助鍍zh_TW
DC.subjectannealing processen_US
DC.subjectIADen_US
DC.subjectMgOen_US
DC.subjectprotective filmen_US
DC.title氧化鎂薄膜作為電極保護膜之研究zh_TW
dc.language.isozh-TWzh-TW
DC.titleResearch of magnesium oxide film as the protective film for electrodesen_US
DC.type博碩士論文zh_TW
DC.typethesisen_US
DC.publisherNational Central Universityen_US

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