DC 欄位 |
值 |
語言 |
DC.contributor | 電機工程學系 | zh_TW |
DC.creator | 朱銘健 | zh_TW |
DC.creator | Ming-chien Chu | en_US |
dc.date.accessioned | 2011-6-8T07:39:07Z | |
dc.date.available | 2011-6-8T07:39:07Z | |
dc.date.issued | 2011 | |
dc.identifier.uri | http://ir.lib.ncu.edu.tw:444/thesis/view_etd.asp?URN=965201053 | |
dc.contributor.department | 電機工程學系 | zh_TW |
DC.description | 國立中央大學 | zh_TW |
DC.description | National Central University | en_US |
dc.description.abstract | 本論文之主題,在於研究探討自我對準矽化鎳奈米電極的製作,以取代高摻雜的複晶矽電極。希望藉此改善奈米電極的串聯阻抗,尤其是操作溫度低於室溫時,所衍生阻抗過大的問題。因此如何控制鎳與複晶矽奈米線的回火條件以形成矽化鎳,以及鎳在奈米線下橫向擴散的機制,則是我們研究的重點。
本論文利用不同大小的複晶矽奈米線,與鎳經回火後形成矽化鎳。藉由調變回火時間(0 ~ 270 sec),來控制奈米尺寸下矽化的長度(630 ~ 1900 nm)。所製作的自我對準矽化鎳奈米線,在調變不同奈米線的幾何尺寸,利用電性量測來進一步的了解,矽化鎳奈米線所形成電極之阻抗。
| zh_TW |
dc.description.abstract | The theme of this paper is to study self-aligned nickel silicide nanoelectrodes to replace the highly doped poly-Si electrodes. Hope to improve the nano- electrodes series resistance, especially when the operating temperature is below room temperature, derived from the problem of excessive resistance. Therefore, how to control the mechanism of lateral diffusion at nano-scale when annealing Ni with poly-Si to from NiSi is our research.
In this thesis, we control the length ( 630 ~ 1900 nm ) of NiSi at nano-scale by modulating the annealing time ( 0 ~ 270 sec ) and making different sizes of poly-Si nano-wires to react with Ni while annealing NiSi. Making a self-aligned of electrode NiSi nano-wires and modulating different geometry of nano-wires can further the understanding of the electrode resistance that NiSi nano-wire forms by using the measurement.
| en_US |
DC.subject | 矽化鎳 | zh_TW |
DC.subject | NiSi | en_US |
DC.title | 自我對準矽化鎳奈米電極之製作與電性分析 | zh_TW |
dc.language.iso | zh-TW | zh-TW |
DC.title | Study of self-aligned nickel silicide nanoelectrodes | en_US |
DC.type | 博碩士論文 | zh_TW |
DC.type | thesis | en_US |
DC.publisher | National Central University | en_US |