參考文獻 |
[1]. H. Taub, et al., “Principles of communication system,” McGraw-Hill, New York, USA, 1986.
[2]. S. Hosoe, “Laser interferometric system for displacement measurement with high precision,” Nanotechnology, Vol.2, pp.88-95, 1991.
[3]. Y. Jourlin, et al., “Compact diffractive interferometric displacement sensor in reflection,” Precision Engineering, Vol.22, pp.1-6, 2002.
[4]. O. G. Helleso, et al., “Interferometric displacement sensor made by integrated optics on glass,” Sensors and Actuators A, Vol.47, pp.478-481, 1995.
[5]. T. Kubota, et al., “Interferometer for measuring displacement and distance,” Optics Letters, Vol.12, pp.310-312, 1987.
[6]. H. Kikuta, et al., “Distance measurement by the wavelength shift of laser diode light,” Applied Optics, Vol.25, pp.2976-2980, 1986.
[7]. U. P. Kumar, et al., “Two-wavelength micro-interferometry for 3-D surface profiling,” Optical and Lasers in Engineering, Vol.47, pp.223-229, 2009.
[8]. O. Sasaki, et al., “Sinusoidal phase modulating interferometry for surface profile measurement,” Applied Optics, Vol.25, pp.3137-3140, 1986.
[9]. T. Suzuki, et al., “Phase locked laser diode interferometry for surface profile measurement,” Applied Optics, Vol.28, pp.4407-4410, 1989.
[10]. R. Crane, “Interference phase measurement,” Applied Optics, Vol.8, pp.538-542, 1969.
[11]. M. H. Chiu, et al., “Angle measurement using total-internal-reflection heterodyne interferometry,” Optical Engineering, Vol.36, pp.1750-1753, 1997.
[12]. M. H. Chiu, et al., “Improved technique for measuring small angle,” Applied Optics, Vol.36, pp.7104-7106, 1997.
[13]. J. Y. Lee, et al., “Improved common-path optical heterodyne interferometer for measuring small optical rotation angle of chiral medium,” Optics Communications, Vol.256, pp.337-341, 2005.
[14]. Y. C. Hung, et al., “Direct measurement of refractive indices of a linear birefringent retardation plate,” Optics Communications, Vol.133, pp.11-16, 1997.
[15]. M. H. Chiu, et al., “Refractive index measurement based on the effects of the total internal refraction and uses of the heterodyne interferometry,” Applied Optics, Vol.36, pp.2936-2939, 1997.
[16]. D. C. Su, et al., “New type of liquid refractometer,” Optical Engineering, Vol.37, pp.2795-2797, 1998.
[17]. J. Y. Lee, et al., “A method for measuring Brewster’s angle by circularly polarized heterodyne interferometry,” Journal of Optics, Vol.29, pp.349-353, 1998.
[18]. W. H. Stevenson, “Optical frequency shifting by means of a rotating diffraction grating,” Applied Optics, Vol.9, pp.649-652, 1970.
[19]. Hong Zhang Hu, “Polarization heterodyne interferometry using a simple rotating analyzer. 1: Theory and error analysis,” Applied Optics, Vol.22, pp.2052-2056, 1983.
[20]. M. P. Kothiyal, et al., “Optical frequency shifter for heterodyne interferometry using counterrotating wave plates,” Optics Letters, Vol.9, pp.319-321, August 1984.
[21]. M. Sargent, et al., “Theory of a Zeeman laser I,” Physical Review Letters, Vol.164, pp.436-449, 1967.
[22]. P. Zeeman, “The effect of magnetisation on the nature of light emitted by a substance,” Nature, Vol.55, pp.347, 1987.
[23]. S. O. Kasap, Optoelectronics and photonics, Prentice Hall Inc., New Jersey, 2001.
[24]. D. C. Su, et al., “A heterodyne interferometer using an electro-optical modulator for measuring small displacements,” Journal of Optics, Vol.27, pp.16-23, 1996.
[25]. K. H. Chen, et al., “An alternative method for measuring small displacements with differential phase difference of dual-prism and heterodyne interferometry,” Measurement, Vol.45, pp.1510-1514, 2012.
[26]. Y. Zhong, et al., “A differential laser Doppler system for one-dimensional in-plane motion measurement of MEMS,” Measurement, Vol.40, pp.623-627, 2007.
[27]. K. Creath, “Interferometric investigation of a diode laser source,” Applied Optics, Vol.24, pp.1291-1293, 1985.
[28]. K. Tatsuno, et al., “Diode laser direct modulation heterodyne interferometer,” Applied Optics, Vol.26, pp.37-40, 1987.
[29]. J. Chen, et al., “Heterodyne interferometer with a frequency-modulated laser diode,” Applied Optics, Vol.27, pp.124-128, 1988.
[30]. Y. Ishii, et al., “Phase-shifting fizeau interference microscope with a wavelength-tunable laser diode,” Optical Engineering, Vol.42, pp.60-67, 2003.
[31]. R. Onodera, et al., “Phase- shifting-locked interferometer with a wavelength-modulated laser diode,” Applied Optics, Vol.24, pp.91-96, 2003.
[32]. J. Y. Lee, et al., “Measurement of in-plane displacement by wavelength-modulated heterodyne speckle interferometry,” Applied Optics, Vol.51, pp.1095-1100, 2012.
[33]. C. M. Sutton, “Non-linearity in length measurement using heterodyne laser Michelson interferometry,” Journal of Physics E: Scientific Instruments, Vol.20, pp.1290-1292, 1987.
[34]. J. Lawal, et al., “Michelson interferometry with 10 pm accuracy,” Review of Scientific Instruments, Vol.71, pp.2669-2676, 2000.
[35]. D. Xiaoli, et al., “High-accuracy absolute distance measurement by means of wavelength scanning heterodyne interferometry,” Measurement Science and Technology, Vol. 9, pp. 1031-1035, 1998.
[36]. M. Nevivre, et al., “High-accuracy translation-rotation encoder with two gratings in a Littrow mount,” Applied Optics, Vol.38, pp.67-76, 1999.
[37]. J. Y. Lee, et al., “Optical heterodyne grating interferometry for displacement measurement with subnanometric resolution,” Sensors and Actuators A: Physical, Vol.137, pp.185-191, 2007.
[38]. C. C. Hsu, et al., “Reflection type heterodyne grating interferometry for in-plane displacement measurement,” Optics Communications, Vol.281, pp.2582-2589, 2008.
[39]. J. Y. Lee, et al., “Optical heterodyne grating shearing interferometry for long-range positioning applications,” Optics Communications, Vol.284, pp.857-862, 2011.
[40]. 雷射二極體(LD)與發光二極體(LED)的發光特性,http://www.phy.fju.edu.tw/files/archive/832_c4f0867b.pdf
[41]. 雷射二極體(ML520G54),http://www.frlaserco.com/download/20130419164238/ml5xx54.pdf
[42]. Y. Ishii, “Wavelength-Tunable Laser-Diode Interferometer,” Optical Review, Vol.6, pp.273-283, 1999.
[43]. F. L. Pedrotti and L. S. Pedrotti, Introduction to optics, Prentice Hall Inc., 1993.
[44]. 吳維庭,「準共光程外差光柵干涉術之研究」,國立中央大學,碩士論文,民國97年。
[45]. J. Y. Lee, et al., “Heterodyne grating interferometer based on a quasi-common-optical-path configuration for a two-degrees-of-freedom straightness measurement,” Applied Optics, Vol.50, pp.1272-1279, 2011.
[46]. Stanford Research System, Model SR850 DSP Lock-In Amplifier, 1992.
[47]. 林正淳,光學機構設計,林正淳,新竹縣,台灣,2008。 |