單光子放射顯微鏡系統之 取樣完整性與影像分析

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姓名

張庭培(Ting-Pei Chang) 查詢紙本館藏

畢業系所

光電科學與工程學系

論文名稱

單光子放射顯微鏡系統之取樣完整性與影像分析
(Sampling Completeness and Image Quality Analysis of Single Photon Emission Microscope)

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摘要(中)

針孔式單光子放射電腦斷層掃描系統(SPECT)為生醫影像研究上的重要利器，在實際系統開發建構前，若能以模擬計算獲得系統的取樣完整性與影像品質評估，可有效降低硬體開發試誤的成本。基於此想法，本研究引入七針孔的單光子放射顯微鏡系統來進行模擬上的取樣完整性演算及影像重建品質的分析。
在模擬的演算上，取樣完整性係數(Sampling Completeness Coefficient, SCC)是由圖伊條件(Tuy’s Condition)在電腦斷層掃描系統下所建立，並修改適用於SPECT系統。我們使用此方法評估七針孔單光子放射電腦斷層掃描系統之取樣完整性，包含圓軌跡與螺旋軌跡的掃描，投影至直徑40 mm之閃爍晶石偵測器，來完成取樣完整性之評估。
而影像品質分析上，我們藉由實驗取得之通量模型與寬度模型數據，建立影像系統矩陣(H matrix)，搭配自主建立之假體模型(Phantom)及最大可能性之期望值最大化演算法(MLEM)來進行影像投影與重建，評估在圓軌跡與螺旋軌跡下之影像品質。並由結果的分析可初步驗證，在進行影像系統建立或實際取像前，可以由取樣完整性的分析來評估不同系統設計或不同軌跡繞行下之影像品質，節省系統開發所需的花費與時間。

摘要(英)

Abstract
In this thesis, we use the seven-pinhole single photon emission microscope system (SPEM), which is a version of single photon emission computed tomography (SPECT) system, to simulate the sampling completeness coefficient and analyze the image quality. In order to lessen the development cost, we simulated the system architecture to predict the results and make sure that the system works properly.
In the simulation process, the Sampling Completeness Coefficient (SCC) is based on Tuy’s condition in a cone-beam CT system. We utilize it to evaluate the SCC of seven-pinhole single photon emission microscope system when an object is projected with circular and helical orbits onto the scintillator with 40 mm diameter.
To acquire high quality images, we need an accurate imaging system matrix, called H matrix, which is established from the flux and width models by using the experimental data. The H matrix is used to forward-project the simulated phantoms and the Maximum Likelihood Expectation Maximization (MLEM) algorithm is used for image reconstruction. The results show that SCC values are consistent with the reconstructed image quality. Therefore, the SCC analysis can be used to evaluate the system architecture, in terms of geometry designs and orbit paths, before building the actual system to lessen the cost and save time.

關鍵字(中)

★ 單光子放射顯微鏡
★ 取樣完整性
★ 影像分析

關鍵字(英)

★ SPEM
★ Sampling Completeness Coefficient
★ Image Quality Analysis

論文目次

摘要 vi
Abstract vii
誌謝 viii
目錄 ix
圖目錄 xii
表目錄 xvii
第一章緒論 1
1.1 研究背景 1
1.2 研究目的 2
1.3 論文架構 2
第二章背景知識及回顧 4
2.1 核子醫學影像 4
2.1.1 單光子放射電腦斷層掃描系統(SPECT) 5
2.1.2 單光子放射顯微鏡(SPEM) 7
2.2 圖伊條件(Tuy’s condition) 9
2.3 螺旋式斷層掃描系統螺距限制 13
2.3.1 平行光束電腦斷層掃描(Parallel-Beam CT) 14
2.3.2 扇形光束電腦斷層掃描系統(Fan-Beam CT) 15
2.3.3 錐束電腦斷層掃描系統(Cone-Beam CT) 17
2.3.4 針孔式單光子放射電腦斷層掃描系統(Pinhole SPECT) 18
第三章取樣完整性模型分析 19
3.1 取樣完整性模擬 19
3.2系統配置 22
3.3 七針孔圓形軌跡模型計算結果 24
3.4 七針孔螺旋軌跡模型計算結果 31
第四章影像品質結果分析 36
4.1影像系統矩陣 36
4.2 物體函數模型(f)之建立 37
4.3 影像系統模型建立 38
4.3.1通量模型與寬度模型 38
4.3.2圓軌投影影像 44
4.3.3螺旋軌投影影像 48
4.4 影像重建結果 53
4.4.1 最大可能性之期望值最大化演算法(Maximum Likelihood Expectation Maximization, MLEM) 54
4.4.2 圓軌影像重建結果 56
4.4.3 螺旋軌影像重建結果 59
4.4.4 Defrise Phantom之影像重建結果 63
4.5結果討論與分析 69
第五章結論與未來展望 79
參考文獻 81

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指導教授

陳怡君

審核日期

2018-8-20

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