參考文獻 |
[1] H. J. Round,"A note on Carborundum,"Electrical world,Vol 49,pp.309-310,(1907).
[2] H.Welker, “über neue halbleitende Verbindungen” Zeitschrift für Naturforschung A, Vol 7, Issue 11, pp.744-749, (1952).
[3] Nick Holonyak Jr. and S.F. Bevacqua1, “Coherent (visible) light emission from Ga(As1-xPx) junctions” Appl. Phys. Lett. Vol. 1, pp. 82-83, (1962).
[4] C. J. Nuese, J. J. Tietjen, J. J. Gannon and H. F. Gossenberger ,“Optimization of Electroluminescent Efficiencies for Vapor‐Grown GaAs1−xPx Diodes” J. Electrochem., Soc. Vol 116, pp. 248-253, (1969).
[5] H. Amano, N. Sawaki and I. Akasaki ,“Metalorganic vapor phase epitaxial growth of a high quality GaN film using an AlN buffer layer” Appl. Phys. Lett., Vol. 48, pp.353, (1986).
[6] Hiroshi Amano, Masahiro Kito, Kazumasa Hiramatsu and Isamu Akasaki,“P-Type Conduction in Mg-Doped GaN Treated with Low-Energy Electron Beam Irradiation (LEEBI)” Jpn. J. Appl. Phys., Vol 28, pp. L2112-L2114, (1989).
[7] S. Nakamura, Takashi Mukai, Masayuki Senoh and Naruhito Iwasa,“Thermal annealing effects on p-type Mg-doped GaN films,”Jpn. J. Appl. Phys., Vol 31, pp.139-142, (1992).
[8] E. F. Schubert,“Light-Emitting Diodes,2nd ed. (Cambridge University Press,Cambridge) ”, (2006).
[9] Justin Iveland, Lucio Martinelli, Jacques Peretti,James S. Speck, and Claude Weisbuch,“Auger effect identified as main cause of efficiency droop in LEDs” SPIENewsroom , (2014).
[10] M. H. Kim, M. F. Schubert, Q. Dai, J. K. Kim, E. F. Schubert, J. Piprek, and Y. Park, “Origin of efficiency droop in GaN-base light-emitting diodes” Appl. Phys. Lett. 91, no. 18, pp. 183507-1-183507-3, (2007).
[11] K. B. Nam, M. K. Nakarmi, J. Li, J. Y. Lin, and H. X. Jiang, “Mg acceptor level in AlN probed by deep ultraviolet photoluminescence” Appl. Phys. Lett., vol. 83, no. 5, pp. 878-880, (2003).
[12] N. I. Bochkareva, V. V. Voronenkov, R. I. Gorbunov, A. S. Zubrilov, Y. S. Lelikov, P. E. Latyshev, Y. T. Rebane, A. I. Tsyuk and Y. G. Shreter, “Defect-related tunneling mechanism of efficiency droop in III-nitride light-emitting diodes” Appl. Phys. Lett., vol. 96, no. 13, pp. 133502-1-133502-3, (2010).
[13] Y. C. Shen, G. O. Mueller, S. Wananabe, N. F. Gardner, A. Munkholm, and M. R. Krames, “Auger recombination in InGaN measured by photoluminescence” Appl. Phys. Lett., vol. 91, no. 14, pp. 141101-1-141101-3, (2007).
[14] J Xie, X Ni, Q Fan, R Shimada, Ümit Özgür and Hadis Morkoç,“On the efficiency droop in InGaN multiple quantum well blue light emitting diodes and its reduction with p-doped quantum well barriers,”Appl. Phys. Lett,vol.93,no.12,pp. 121107-1-121107-3, (2008).
[15] J. Xu, M. F. Schubert, A. N. Noemaun, D. Zhu, J. K. Kim, E. F. Schubert, M. H. Kim, H. J. Chung, S. Yoon, C. Sone, and Y. Park, “Reduction in efficiency droop, forward voltage, ideality factor, and wavelength shift in polarization-matched GaInN/GaInN multi-quantum-well light-emitting diodes,” Appl. Phys. Lett., vol. 94, no. 1, pp. 011113-1-011113-3, (2009).
[16] M. F. Schubert, J. Xu, J. K. Kim, E. F. Schubert, M. H. Kim, S. Yoon, S. M. Lee, C. Sone, T. Sakong, and Y. Park,“Polarization-matched GaInN∕AlGaInN multi-quantum-well light-emitting diodes with reduced efficiency droop,”Appl.Phys. Lett., vol.93,no. 4,, pp. 041102-1-041102-3,(2008).
[17] N. F. Gardnera, G. O. Müller, Y. C. Shen, G. Chen, S. Watanabe, W. Götz, and M. R. Krames, “Blue-emitting InGaN–GaN double-heterostructure light-emitting diodes reaching maximum quantum efficiency above 200 A/cm2,” Appl. Phys. Lett., vol. 91, no. 24, pp. 243506-1-243506-3, (2007).
[18] K. Akita, T. Kyono, Y. Yoshizumi, H. Kitabayashi, and K. Katayama, “Improvements of external quantum efficiency of InGaN-based blue light-emitting diodes at high current density using GaN substrates,” J. Appl. Phys., vol. 101, no. 3, pp. 033104-1-033104-5, (2007).
[19] M. Miyoshi, A. Watanabe, T. Egawa, “Modeling of the wafer bow in GaN-on-Si epiwafers employing GaN/AlN multilayer buffer structures”, Semicond. Sci. Technol., vol. 31, no. 10, pp. 105016-1-105016-7, (2016).
[20] S. Zamir, B. Meyler, and J. Salzman “Reduction of cracks in GaN films grown on Si-on-insulator by lateral confined epitaxy”, J. Crystal Growth 243, 375, (2002).
[21] Ayers,John E, “Heteroepitaxy of semiconductors”,p164, (2007).
[22] Michael E. Levinshtein, Sergey L. Rumyantsev and Michael S. Shur, “PROPERTIES OF ADVANCED SEMICONDUCTOR MATERIALS”.p3, (2001).
[22] Katsuhiko Inaba, “General features of GaN-related materials” , Rigaku Journal,30(1), (2014).
[23] Chen-Fu Chu, Fang-I Lai, Jung-Tang Chu, Chang-Chin Yu, Chia-Feng Lin,
Hao-Chung Kuo, and S. C. Wang, “Study of GaN light-emitting diodes fabricated by laser lift-off technique” , Journal of Applied Physics 95, 3916, (2004).
[24] Michael E. Levinshtein, Sergey L. Rumyantsev and Michael S. Shur,
“PROPERTIES OF ADVANCED SEMICONDUCTOR MATERIALS”.p95, (2001).
[25] Sichel, E.K., Pankove J.I., “Thermal conductivity of GaN25-360 K”, J. Phys. Chem. Solids 38, 3, 330, (1977).
[26] J. F. Muth, J. H. Lee, I. K. Shmagin, and R. M. Kolbas, “Absorption coefficient, energy gap, exciton binding energy, and recombination lifetime of GaN obtained from transmission measurements”, Appl. Phys. Lett. 71, 2572, (1997).
[27] BAKHTIAR UL HAQ, A. AFAQ, R. AHMED and S. NASEEM, “A COMPREHENSIVE DFT STUDY OF ZINC OXIDE IN DIFFERENT PHASES ”, Modern Physics C,Vol. 23, No. 6 ,1250043, (2012).
[28] E. Fred Schubert, “Light-Emitting Diodes ”, 3rd edition, (2006).
[29] G. T. Chen et al,Appl. Phys. Lett.49 140, (1986).
[30] Guan-Ting Chen , Chia-Hua Chan , Chia-Hung Hou , Hsueh-Hsing Liu , Nai-Wei Shiu , Mao-Nan Chang , Chii-Chang Chen , and Jen-Inn Chyi, “Epitaxial lateral overgrowth of GaN on AlGaN/(111)Si micropillar array fabricated by polystyrene microsphere lithography”, Proc. of SPIE Vol. 6894 689408, (2008).
[31] D Zhu, D J Wallis and C J Humphreys, “Prospects of III-nitride optoelectronics grown on Si”, Rep. Prog. Phys. ,vol 76 ,pp.106501, (2013).
[32] S. D. Hersee, X. Y. Sun, X. Wang, M. N. Fairchild, J. Liang and J. Xu, “Nanoheteroepitaxial growth of GaN on Si nanopillar arrays”, J. Appl. Phys. 97,124308, (2005).
[33] Hongbo Qin, Xinghe Luan, Chuang Feng, Daoguo Yang and Guoqi Zhang, “Mechanical, Thermodynamic and Electronic Properties of Wurtzite and Zinc-Blende GaN Crystals”, MDPL,Materials, 10, 1419, (2017).
[34] Yoshitaka Taniyasu and Makoto Kasu, “Improved Emission Efficiency of 210-nm Deep-ultraviolet Aluminum Nitride Light-emitting Diode”, Special Feature. Vol. 8 No., (2010).
[35] C. Wetzel,M. Zhu,J. Senawiratne,T. Detchprohm,P.D. Persans ,L. Liu,E.A. Preble, D. Hanser, “Light-emitting diode development on polar and non-polar GaN
substrates”, Journal of Crystal Growth, Volume 310, Issue 17, (2008).
[36] Houqiang Fu, Zhijian Lu, and Yuji Zhao, “Analysis of low efficiency droop of semipolar InGaN quantum well light-emitting diodes by modified rate equation with weak phase-space filling effect”, AIP ADVANCES 6, 065013, (2016).
[37] Christof Mauder, “Physics, MOVPE growth, and investigation of m-plane GaN films and InGaN/GaN quantum wells on γ-LiAlO2 substrates”, (2012).
[38] X. Li,X. Ni, J. Lee, M. Wu, Ü. Özgür, H. Morkoç, T. Paskova, G. Mulholland,and K. R. Evans, “Efficiency retention at high current injection levels in m-plane InGaN light emitting diodes”, APL, 95, 121107, (2009).
[39] A. E. Romanov,a T. J. Baker, S. Nakamura, and J. S. Speckb, “Strain-induced polarization in wurtzite III-nitride semipolar layers”, Appl. Phys. 100, 023522, (2006).
[40] R. Sharma,P. M. Pattison,H. Masui, R. M. Farrell, T. J. Baker, B. A. Haskell, F. Wu, S. P. DenBaars, J. S. Speck, and S. Nakamura, “Demonstration of a semipolar (10-1-3 )InGaN/GaN green light emitting diode”, Appl 87, 231110, (2005).
[41] O. Ambacher, J. Smart, J. R. Shealy, N. G. Weimann, K. Chu, M. Murphy, W. J. Schaff, L. F. Eastman,R. Dimitrov, L. Wittmer, and M. Stutzmann, W. Rieger and J. Hilsenbeck, “Two-dimensional electron gases induced by spontaneous and piezoelectric polarization charges in N- and Ga-face AlGaN/GaN heterostructures”, Appl. phys. 85,3222, (1999).
[42] Hadis Morkoç, “ Nitride Semiconductors and Devices”, (2009).
[43] Hongbo Qin , Xinghe Luan , Chuang Feng , Daoguo Yang and Guoqi Zhang, “Mechanical, Thermodynamic and Electronic Properties of Wurtzite and Zinc-Blende GaN Crystals ”,Materials, 10, 1419, (2017)
[44]D. A. B. Miller, D. S. Chemia, and T.C. Damen, A. C. Gossard, W. Wiegmann, T. H. Wood and C. A. Burrus, “Band-Edge Electroabsorption in Quantum Well Structures: The Quantum-Confined Stark Effect ”,Phys. Rev. Lett. 53,2173, (1984).
[45] A. E. Romanov, T. J. Baker, S. Nakamura, and J. S. Speck, “Strain-induced polarization in wurtzite III-nitride semipolar layers ”,Appl ,Physics, 100(2), (2006).
[46] Fabio Bernardini, Vincenzo Fiorentini and David Vanderbilt, “Spontaneous polarization and piezoelectric constants of III-V nitrides”, The American Physical Society, PHYSICAL REVIEW B, (1997).
[47] M. L. Reed, E. D. Readinger, Shen, Wraback, Syrkin, Usikov, V. Kovalenkov and V. A. Dmitriev, “n-ingan/p-gan single heterostructure light emitting diode with p-side down”, Appl, Phys, 93,133505, (2008).
[48] O. Madelung, “Semiconductors; data handbook ”, (2003).
[49] T. Kozawa, T. Kachi, H. Kano, H. Nagase, N. Koide and K. Manabe, “Thermal stress in gan epitaxial layers grown on sapphire substrates.”, Appl. Phys. Lett. Vol. 77,pp. 4389-4392, (1995).
[50] T. Matsuoka, Y. Kobayahi, H. Takahata, T. Mitate, S. Mizuno, A. Sasaki, M. Yoshimoto, T. Ohnishi and M. Sumiya, “N-polar GaN on sapphire substrate grown by MOVPE”, Phys. Stat. Sol. ,vol.243, no. 7,pp. 1446-1450, (2006).
[51] B. Daudin, J. L. Rouviere and M. Arlery, “Polarity determination of GaN films by ion channeling and convergent beam electron diffraction”, Appl. Phys. Lett, Vol. 69, no. 17, pp. 2480-2482, (1996).
[52] M. Seelmann-Eggebert, J. L. Weyher, H. Obloh, H. Zimmermann, A. Rar, and S. Porowski, “Polarity of (00.1) GaN epilayers grown on a (00.1) sapphire ”,Appl. Phys. Lett, Vol. 71, no. 18., pp. 2635-2637, (1997).
[53] S. Bensmaine, L. Le Brizoual, O. Elmazria, B. Assouar and B. Benyoucef,” The effects of the deposition parameters of ZnO thins films on their structural properties”, Electron Devices, vol. 5, pp. 104-109, ( 2007).
[54] 陳建嘉,”Nanoheteroepitaxial growth of GaN on Si substrates”, National Central University, Master′s Thesis, (2013).
[55] N. Li, “GaN on ZnO: A NEW APPROACH TO SOLID STATE LIGHTING”, Georgia Institute of Technology, (2009).
[56] M. Grunze, W. Hirschwald and D. Hofmann,”Zinc OXIDE: SURFACE STRUCTURE, STABILITY, AND MECHANISMS OF SURFACE REACTIONS” J. Cryst. Growth Vol 52, pp. 241-249, (1981).
[57] Francisco Solís-Pomar, Eduardo Martínez, Manuel F Meléndrez and Eduardo Pérez Tijerina,” Growth of vertically aligned ZnO nanorods using textured ZnO films”, Nanoscale Res. Lett., Vol 6, pp. 524 , (2011).
[58] Shih-Wei Chen and Jenn-Ming Wu,” Nucleation mechanisms and their influences on characteristics of ZnO nanorod arrays prepared by a hydrothermal method”, Acta Materialia., Vol 59, pp. 841–847, (2011).
[59] Q. C. Li, V. Kumar, Y. Li, H. T. Zhang, T. J. Marks and R. P. H. Chang,“Fabrication of ZnO Nanorods and Nanotubes in Aqueous Solutions“, Chem. Mater., Vol 17, pp. 1001-1006, (2005).
[60] Hiroaki Fukushima, Tomomi Kozu, Hiromi Shima, Hiroshi Funakubo, Hiroshi Uchida, Takashi Katod and Ken Nishida,“ Evaluation of oxygen vacancy in ZnO using Raman spectroscopy “,IEEE, (2015).
[61] Michael E. Levinstin, Sergey L. Rumyyantsev, Michael S. Shur,“PROPERTIES OF ADVANCED SEMICONDUCTOR MATERIALS GaN, AlN, InN, BN, SiC, SiGe “, (2001).
[62] Ali Vazinishayan, Shuming Yang, Dasaradha Rao Lambada and Yiming Wang,“Mechanical behavior enhancement of ZnO nanowire by embedding
different nanowires“, Results in Physics 9, (2018). |