參考文獻 |
[1] R. R. Schaller, "Moore′s law: past, present and future," IEEE spectrum, vol. 34, no. 6, pp. 52-59, 1997.
[2] G. Han, S. Sun, and M. "Dong, Capacity Collaboration in Semiconductor Supply Chain with Failure Risk and Long-term Profit,": Supply Chain Management, G. Han Ed. New York: InTech, 2011, pp.185-200.
[3] 蕭宏,半導體製程技術導論,全華圖書,2014,25-38頁。
[4] M. P. Groover, "Electronics assembly and packaging," Fundamentals of modern manufacturing: materials, processes, and systems, M. P. Groover Ed. Hoboken: John Wiley & Sons, 2010, pp.831-835
[5] M. Rahko, "Theory for the QT feasibility qualification parameters" A qualification tool for component package feasibility in infrastructure products, M. Rahko Ed. Linnanmaa: Oulu University Oulu, 2011, pp.63-66
[6] K.-N. Tu, "Introduction," in Solder Joint Technology: Materials, Properties, and Reliability, K.-N. Tu Ed. New York, NY: Springer New York, 2007, pp. 1-33.
[7] M. A. Aziz, M. Abdullah, C. Khor, and F. C. Ani, "Influence of pin offset in PCB through-hole during wave soldering process: CFD modeling approach," International Communications in Heat and Mass Transfer, vol. 48, pp. 116-123, 2013.
[8] C. Durand, M. Klingler, D. Coutellier, and H. Naceur, "Power cycling reliability of power module: A survey," IEEE Transactions on Device and Materials Reliability, vol. 16, no. 1, pp. 80-97, 2016.
[9] K.-N. Tu, J.-o. Suh, A. T.-C. Wu, N. Tamura, and C.-H. Tung, "Mechanism and prevention of spontaneous tin whisker growth," Materials transactions, vol. 46, no. 11, pp. 2300-2308, 2005.
[10] B. Huang and N.-C. Lee, "Solder bumping via paste reflow for area array packages," in 27th Annual IEEE/SEMI International Electronics Manufacturing Technology Symposium, 2002: IEEE, pp. 1-17.
[11] R. Beica, "Flip chip market and technology trends," in 2013 Eurpoean Microelectronics Packaging Conference (EMPC), 2013: IEEE, pp. 1-4.
[12] J. Lau et al., "Redistribution layers (RDLs) for 2.5 D/3D IC integration," Journal of Microelectronics and Electronic Packaging, vol. 11, no. 1, pp. 16-24, 2014.
[13] T. Kim, H. Son, S.-K. Lim, Y. Song, and S. Suh, "Silicon interposer BGA package with a Cu-filled through silicon via and a multilayer redistribution layer fabricated via electroplating," Journal of Nanoscience and Nanotechnology, vol. 14, no. 12, pp. 8987-8992, 2014.
[14] G. Kumar, T. Bandyopadhyay, V. Sukumaran, V. Sundaram, S. K. Lim, and R. Tummala, "Ultra-high I/O density glass/silicon interposers for high bandwidth smart mobile applications," in 2011 IEEE 61st Electronic Components and Technology Conference (ECTC), 2011: IEEE, pp. 217-223.
[15] S. F. Al-Sarawi, D. Abbott, and P. D. Franzon, "A review of 3-D packaging technology," IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part B, vol. 21, no. 1, pp. 2-14, 1998.
[16] K. N. Tu, "Reliability challenges in 3D IC packaging technology," Microelectron. Reliab, vol. 51, no. 3, pp. 517-523, 2011.
[17] M. Vujosevic, "Thermally induced deformations in die-substrate assembly," Theoretical and Applied Mechanics, vol. 35, pp. 305-322, 2008.
[18] M. Loomans, S. Vaynman, G. Ghosh, and M. Fine, "Investigation of multi-component lead-free solders," Journal of electronic materials, vol. 23, pp. 741-746, 1994.
[19] Z.-M. Dang, J.-K. Yuan, J.-W. Zha, T. Zhou, S.-T. Li, and G.-H. Hu, "Fundamentals, processes and applications of high-permittivity polymer–matrix composites," Progress in materials science, vol. 57, no. 4, pp. 660-723, 2012.
[20] Z. Mei, H. A. Holder, and H. A. Vander Plas, "Low-temperature solders," Hewlett Packard Journal, vol. 47, pp. 91-98, 1996.
[21] M. Abtew and G. Selvaduray, "Lead-free solders in microelectronics," Materials Science and Engineering, vol. 27, no. 5-6, pp. 95-141, 2000.
[22] S. M. Abdelaziz, H. Zahran, and A. Abd El-Rehim, "Microstructure and mechanical properties of tin-bismuth solder alloy reinforced by antimony oxide nanoparticles," International Journal of Advances in Engineering & Technology, vol. 10, no. 1, p. 73, 2017.
[23] C.-H. Yeh, L.-S. Chang, and B. Straumal, "Wetting transition of grain boundaries in the Sn-rich part of the Sn–Bi phase diagram," Journal of materials science, vol. 46, pp. 1557-1562, 2011.
[24] H. Kim, H. Liou, and K.-N. Tu, "Morphology of instability of the wetting tips of eutectic SnBi, eutectic SnPb, and pure Sn on Cu," Journal of materials research, vol. 10, no. 3, pp. 497-504, 1995.
[25] X. Chen, F. Xue, J. Zhou, and Y. Yao, "Effect of In on microstructure, thermodynamic characteristic and mechanical properties of Sn–Bi based lead-free solder," Journal of Alloys and Compounds, vol. 633, pp. 377-383, 2015.
[26] A. K. Gain and L. Zhang, "Growth mechanism of intermetallic compound and mechanical properties of nickel (Ni) nanoparticle doped low melting temperature tin–bismuth (Sn–Bi) solder," Journal of Materials Science: Materials in Electronics, vol. 27, pp. 781-794, 2016.
[27] W. Dong, Y. Shi, Z. Xia, Y. Lei, and F. Guo, "Effects of trace amounts of rare earth additions on microstructure and properties of Sn-Bi-based solder alloy," Journal of Electronic Materials, vol. 37, pp. 982-991, 2008.
[28] F. Wang, Y. Huang, Z. Zhang, and C. Yan, "Interfacial reaction and mechanical properties of Sn-Bi solder joints," Materials, vol. 10, no. 8, pp. 920, 2017.
[29] Q. Xu, X. Liu, and H. Zhang, "Current enhanced wettability of eutectic SnBi melt on Cu substrate," Materials Science and Technology, vol. 27, no. 3, pp. 666-669, 2011.
[30] M. Ribas et al., "Development of low-temperature drop shock resistant solder alloys for handheld devices," in 2013 IEEE 15th Electronics Packaging Technology Conference (EPTC 2013), 2013: IEEE, pp. 48-52.
[31] F. Wang, L. Zhou, X. Wang, and P. He, "Microstructural evolution and joint strength of Sn-58Bi/Cu joints through minor Zn alloying substrate during isothermal aging," Journal of Alloys and compounds, vol. 688, pp. 639-648, 2016.
[32] P. Shang, Z. Liu, D. Li, and J. Shang, "Bi-induced voids at the Cu3Sn/Cu interface in eutectic SnBi/Cu solder joints," Scripta Materialia, vol. 58, no. 5, pp. 409-412, 2008.
[33] D. Ye, C. Du, M. Wu, and Z. Lai, "Microstructure and mechanical properties of Sn–x Bi solder alloy," Journal of Materials Science: Materials in Electronics, vol. 26, pp. 3629-3637, 2015.
[34] Z. Wang, Q. Zhang, Y. Chen, and Z. Song, "Influences of Ag and In alloying on Sn-Bi eutectic solder and SnBi/Cu solder joints," Journal of Materials Science: Materials in Electronics, vol. 30, pp. 18524-18538, 2019.
[35] P. T. Vianco and D. R. Frear, "Issues in the replacement of lead-bearing solders," JOM, vol. 45, pp. 14-19, 1993.
[36] N. Eustathopoulos, "Dynamics of wetting in reactive metal/ceramic systems," Acta Materialia, vol. 46, no. 7, pp. 2319-2327, 1998.
[37] S. Jung, "Fluid characterisation and drop impact in inkjet printing for organic semiconductor devices," University of Cambridge, pp.25-29, 2011.
[38] N.-C. Lee, "Solder pasre technology," Reflow soldering processes and troubleshooting : SMT, BGA, CSP, and flip chip technologies, N.-C. Lee Ed. Boston: Newnes Boston, 2002. pp,37-43.
[39] D. Bušek et al., "Flux effect on void quantity and size in soldered joints," Microelectron. Reliab, vol. 60, pp. 135-140, 2016.
[40] A. M. Erer, S. Oguz, and Y. Türen, "Influence of bismuth (Bi) addition on wetting characteristics of Sn-3Ag-0.5 Cu solder alloy on Cu substrate," Engineering Science and Technology, an International Journal, vol. 21, no. 6, pp. 1159-1163, 2018.
[41] R. Sayyadi and H. Naffakh-Moosavy, "The role of intermetallic compounds in controlling the microstructural, physical and mechanical properties of Cu-[Sn-Ag-Cu-Bi]-Cu solder joints," Scientific Reports, vol. 9, no. 1, p. 8389, 2019. |