參考文獻 |
[1]Azzam R.M. Am, and N.M. Bashara, ”Ellipsometry and polarized light”, North-Holland publishing Company, Netherlands,(1977)
[2]李正中,薄膜光學與鍍膜技術 第四版,藝軒圖書出版社, 台北,385-396(2004)
[3]R T Phillips, “A numerical method for determining the complex refractive index from reflectance and transmittance of supported thin films,” J. Phys. D: Appl. Phys., 16 , pp. 489-497 (1983)
[4]R E DENTON, R D CAMPBELL and S G TOMLIN, “The determination of the optical constants of thin films from measurements of reflectance and transmittance at normal incidence,” J. Phys. D: Appl. Phys., 5 , pp. 852-863 (1972)
[5]J. C. Manifacier, J. Gasiot and J. P. Fillard, “A simple method for determination of the optical constant n , k and the thickness of weekly absorbing thin films ,” J. Phy. E. Sci., 9, pp.1002-1004 (1976)
[6]何聰慧, “光學薄膜常數之計算”,國立中央大學光電所碩士論文,,(2002)
[7]Kirkpatrick, S.,Gelatt, C. D., and Vecchi, M. P., “Optimization by simulated annealing,” Science, 200 , pp. 671-680 (1983)
[8]Kirkpatrick, “Optimization by Simulated Annealing: Quantitative Studies,”S. Journal of Statistical Physics, 34, pp. 975–986 (1984)
[9]Acton, F.S., Numerical Methods That Work; corrected edition , Washington: Mathematical Association of America, pp. 55; 454–458(1990)
[10]Holland, J.H., Adaptation in Natural and Artificial Systems. University of Michigan Press, Ann Arbor.Mich,(1975)
[11] N Metropolis, M Rosenbluth, M Rosenbluth, A Teller, and E Teller.” Equation of state calculations for fast computing machines,” Journal of Chemical Physics, 6 , pp. 1087-1092(1953)
[12]W. Press, S. Teukolsky, T. Vetterling, B. Flannery, ”Numerical Recipes in C: The Art of Scientific Computing”, 2nd Edition, Cambridge University Press, New York, (1992)
[13] Knuth, D.E., ”Seminumerical Algorithms” , 2nd Edition, vol. 2 of The Art of Computer Programming, Reading, MA: Addison-Wesley, 3.2–3.3. (1981)
[14]J. A. Dobrowolski, F. C. Ho, A. Belkind, and V. A. Koss, “Merit functions for more effective thin film calculations,” Applied Optics,28(14), pp. 2824-2831 (1989)
[15]J. A. Dobrowolski and R. A. Kemp, “Refinement of optical multilayer systems with different optimization procedures,” Applied Optics, 29(19), pp. 2876-2893 (1990) |