以累積差異及多重解析度背景相減偵測 LCD Mura 瑕疵

以作者查詢圖書館館藏

、以作者查詢臺灣博碩士

、以作者查詢全國書目

、勘誤回報

、線上人數：52

、訪客IP：3.149.24.145

姓名

謝承恩(Cheng-En Shie) 查詢紙本館藏

畢業系所

資訊工程學系

論文名稱

以累積差異及多重解析度背景相減偵測 LCD Mura 瑕疵
(LCD Mura Detection using Accumulated Differences and Multisolution Background Subtraction)

相關論文

★ 適用於大面積及場景轉換的視訊錯誤隱藏法	★ 虛擬觸覺系統中的力回饋修正與展現
★ 多頻譜衛星影像融合與紅外線影像合成	★ 腹腔鏡膽囊切除手術模擬系統
★ 飛行模擬系統中的動態載入式多重解析度地形模塑	★ 以凌波為基礎的多重解析度地形模塑與貼圖
★ 多重解析度光流分析與深度計算	★ 體積守恆的變形模塑應用於腹腔鏡手術模擬
★ 互動式多重解析度模型編輯技術	★ 以小波轉換為基礎的多重解析度邊線追蹤技術(Wavelet-based multiresolution edge tracking for edge detection)
★ 基於二次式誤差及屬性準則的多重解析度模塑	★ 以整數小波轉換及灰色理論為基礎的漸進式影像壓縮
★ 建立在動態載入多重解析度地形模塑的戰術模擬	★ 以多階分割的空間關係做人臉偵測與特徵擷取
★ 以小波轉換為基礎的影像浮水印與壓縮	★ 外觀守恆及視點相關的多重解析度模塑

檔案

[Endnote RIS 格式]

[Bibtex 格式]

[相關文章]

[文章引用]

[完整記錄]

[館藏目錄]

[檢視]

[下載]

本電子論文使用權限為同意立即開放。
已達開放權限電子全文僅授權使用者為學術研究之目的，進行個人非營利性質之檢索、閱讀、列印。
請遵守中華民國著作權法之相關規定，切勿任意重製、散佈、改作、轉貼、播送，以免觸法。

摘要(中)

近年來，薄膜電晶體液晶顯示器(Thin-Film Transistor Liquid-Crystal Display) 相關裝置及設備在市場中愈來愈受歡迎，且競爭也愈來愈激烈。因此檢測薄膜電晶體液晶顯示器品質的議題也愈受到注意，這個議題也同時考驗著生產者的能力。薄膜電晶體液晶顯示器主要是由彩色濾光片玻璃基板、薄膜電晶體玻璃基板、液晶、和背光模組所組成。這些組成元件在製程中，會因某些因素而造成產品的瑕疵。為了維護薄膜電晶體液晶顯示器的品質及降低檢測的成本，我們發展一套針對彩色濾光片玻璃基板的Mura瑕疵檢測系統。
我們的方法是透過累加同一彩色濾光片玻璃基板在連續影像序列中的灰階，藉以擴大Mura瑕疵與背景的差異，才得以準確的檢測Mura瑕疵。我們的Mura瑕疵檢測系統主要包含三個部份。一、藉由平均背景影像與未校正影像相除，以校正不均勻的照度。二、藉由相關性 (correlation)　數學模式來校正連續影像之不均勻的位移。三、累加校正影像並以多重解析度影像來分析背景以檢測Mura瑕疵。
我們的檢測影像大小有1024?1024或256?256。在實驗中我們的提供測試影像包含真實影像及人工影像，人工影像中有region Mura、line Mura、cloud Mura、twill line Mura、和ring Mura。從實驗結果中，我們驗證了我們的方法可以穩定地檢測出與背景相差大約5個灰階以上的Mura瑕疵。

摘要(英)

As TFT-LCD (Thin-Film Transistor Liquid-Crystal Display) devices get more and more popular and competitive in display market; the inspection of TFT-LCD quality has received increasing attention and become a more critical issue for manufacturers. TFT-LCD is composed of CF (Color Filter) glass substrate, TFT glass substrate, liquid crystal, and back light module. To maintain the quality of TFT-LCD, we develop a Mura inspection method to detect defects on CF glass substrates.
In the proposed method, we accumulate the difference between the Mura defect in an image sequence and background; the background was constructed from multiresolution images to adapt the variant of the acquired images. Then according to analyzing the characters of Mura defects and production lines, we propose the automatic inspection system with three processes. First, we calibrate non-uniform illuminance by dividing an average background. Second, we calibrate non-uniform displacement by using correlation. Finally, we detect Mura defect on the calibrated accumulated images. Our input data is an image sequence (1024?1024 or 256?256). Both real Mura defects and several artificial Mura defects like region Mura, line Mura, cloud Mura, twill line Mura, and ring Mura are used for testing in our experiments. From the experimental results, we find the proposed method can stably detect unclear Mura defect.

關鍵字(中)

★ 液晶薄膜顯示器
★ Mura 瑕疵
★ 多重解析度

關鍵字(英)

★ TFT-LCD
★ Mura defect
★ multiresolution

論文目次

摘要 II
誌謝 III
目錄 IV
第一章緒論一
第二章相關研究二
第三章校正不均照度和位移三
第四章瑕疵檢測四
第五章實驗五
第六章結論六
附錄英文版論文七

參考文獻

[1] Baek, S. I., W. S. Kim, T. M. Koo, I. Choi, and K. H. Park, "Inspection of defect on LCD panel using polynomial approximation," in Proc. IEEE Conf. on TENCON, Chiang Mai, Thailand, Nov.21-24, 2004, pp.235-238.
[2] Chen, H.-C., L.-T. Fang, L. Lee, C.-H. Wen, S.-Y. Cheng, and S.-J. Wang, "LOG-filter based inspection of cluster mura and vertical-band mura on liquid crystal displays," in Proc. of Conf. Machine Vision Applications in Industrial Inspection XIII, San Jose, California, Jan.17-18, 2005, pp.257-265.
[3] Choi, K. N., J. Y. Lee, and S. I. Yoo, "Area-mura detection in TFT-LCD panel," in Vision geometry XII, San Jose, California, Jan.18-19, 2004, pp.151-158.
[4] Fang, L. T., H. C. Chen, I. C. Yin, S. J. Wang, C. H. Wen, and C. H. Kuo, "Automatic mura detection system for liquid crystal display panels," in Proc. of Conf. SPIE-IS&T Electronic Imaging, San Jose, California, Jan.15-19, 2006, pp.143-152.
[5] Forsey, D. R. and R. H. Bartels, "Surface fitting with hierarchical splines," ACM Trans. on Graphics, vol.14, no.2, pp.134-161, Apr. 1995.
[6] Jiang, B. C., C. C. Wang, and H. C. Liu, "LCD surface uniformity defect inspection study," in Proc. the 8th Annual Int. Conf. on Industrial Engineering - Theory, Applications and Practice, Las Vegas, Nevada, Nov.10-12, 2003, pp.621-625.
[7] Jiang, B. C., C. C. Wang, D. M. Tsai, and H. C. Liu, "LCD surface defect inspection using machine vision," in Proc. the 5th Asia-pacific Conf. on Industrial Engineering and Management Systems, Gold Coast, Australia, Dec.12-15, 2004, pp.24.7.1-24.7.9.
[8] Lee, J. Y. and S. I. Yoo, "Automatic detection of region-mura defect in TFT-LCD," IEICE Transactions on Information and Systems, vol.E87-D, no.10, pp.2371-2378, Oct. 2004.
[9] Lee, G. B., W. S. Kim, Y. S. Chung, J. J. Lee, and K. H. Park, "Adaptive surface fitting for inspection of FPD devices using multilevel B-spline approximation," in Proc. IEEE Tencon’05, Melbourne, Australia, Nov.21-24, 2005, pp.1445-1448.
[10] Lin, H. D. and C. H. Chien, "Automated detection of color non-uniformity defects in TFT-LCD," in Proc. Int. Joint Conf. on Neural Networks, Vancouver, BC, Canada, Jul.16-21, 2006, pp.1405-1412.
[11] Lu, C. J. and D. M. Tsai, "Defect inspection of patterned TFT-LCD panels using a fast sub-image based SVD," Int. Journal of Production Research, vol.42, pp.4331-4351, 2004.
[12] Nakano, H. and Y. Mori, "Measurement method for low-contrast nonuniformity in liquid crystal displays by using multi-wavelet analysis," in Proc. of SPIE on Optical Diagnositcs, Bellingham, WA, Aug.18, 2005, pp.588013-1-588013-6.
[13] Oh, J. H., D. M. Kwak, K.B. Lee, Y.C. Song, D.H. Choi, and K.H. Park, "Line defect detection in TFT-LCD using directional filter bank and adaptive multilevel thresholding," Key Engineering Material, vol.270-273, pp.233-238, 2004.
[14] Oh, J. H., W. S. Kim, C. H. Han, and K. H. Park, "Defect detection of TFT-LCD image using adapted contrast sensitivity function and wavelet transform," IEICE Trans. on Electronics, vol.E90-C, no.11, pp.2131-2135, Nov. 2007.
[15] Park, N. K., K. N. Choi, and S. I. Yoo, "Quantification of line Mura defect levels based on multiple characterizing features," in Proc. SPIE-IS&T Conf. on Electronic Imaging, San Jose, California, Jan.17-18, 2006, pp.1-8.
[16] Ryu, J. S., J. H. Oh, J.G. Kim, T. M. Koo, and K. H. Park, "TFT-LCD panel blob-mura inspection using the correlation of wavelet coefficients," in TENCON 2004. IEEE Region 10 Conf., Hong Kong, Nov.21-24, 2004, pp.219-222.
[17] Song, Y. C., D. H. Choi, and K. H. Park, "Morphological blob-mura defect detection method for TFT-LCD panel inspection," Lecture Notes in Artificial Intelligence, vol.3215, pp.862-868, 2004.
[18] Song, Y. C., D. H. Choi, and K. H. Park, "Multiscale detection of defect in thin film transistor liquid crystal display panel," Japanese Journal of Applied Physics, vol.43, no.8A, pp.5465-5468, 2004.
[19] Tamura, T., T. Satoh and T. Uchida, "Quantitative evaluation of luminance nonuniformity Mura in LCDs based on just noticeable difference (JND) contrast at various background luminances," IEICE Trans. Electron, vol.E89-C, no.10, pp.1435-1440, 2006.
[20] Taniguchia, K., K. Ueta, and S. Tatsumi, "A detection method for irregular lightness variation of low contrast," in Proc. IEEE Int. Conf. on Systems, Man and Cybernetics, The Hague, Netherlands, Oct.10-13, 2004, pp.6401-6406.
[21] Taniguchia, K., K. Ueta, and S. Tatsumi, "A mura detection method," Pattern Recognition, vol.39, pp.1044-1052, 2006.
[22] Tsai, D. M. and C. Y. Hung, "Automatic defect inspection of patterned thin film transistor-liquid crystal (TFT-LCD) panels using one-dimensional Fourier reconstruction and wavelet decomposition," Int. Journal of Production Research, vol.43, no.21, pp.4589-4607, 2005.
[23] Tsai, D. M., S. T. Chuang, and Y. H. Tseng, "One-dimensional-based automatic defect inspection of multiple patterned TFT-LCD panels using Fourier image reconstruction," Int. Journal of Production Research, vol.45, no.6, pp.1297-1321, 2007.
[24] Wang, Z. and M. Ling, "Implementation of region-mura detection based on recursive polynomial-surface fitting algorithm," in ASIM2006, Hong Kong, China, Dec.12-15, 2006, pp.1-6.
[25] Yoshitake, R. and T. Tamura, "New Standard: Definition of Measurement Index (SEMU) for Luminance Mura in FPD Image Quality Inspection," Semiconductor Equipment and Materials Int. standard, vol.4113, pp.242-249, 2002.

指導教授

曾定章(Din-Chang Tseng)

審核日期

2008-7-15

推文