On the structure and characterization of Al, Sc-co-doped ZnO-films varying with 0-2.37 wt.% Sc contents

NCUIR > Engineering College > National Central University Department of Chemical & Materials Engineering > journal & Dissertation > Item 987654321/26410

Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/26410

Title:	On the structure and characterization of Al, Sc-co-doped ZnO-films varying with 0-2.37 wt.% Sc contents
Authors:	Lin,JC;Peng,KC;Yeh,TY;Lee,SL
Contributors:	化學工程與材料工程學系
Keywords:	HIGHLY TRANSPARENT;OPTICAL-PROPERTIES;RF
Date:	2009
Issue Date:	2010-06-29 17:27:25 (UTC+8)
Publisher:	中央大學
Abstract:	Thin films of Al, Sc-co-doped ZnO varying with Sc-contents were sputtered on the glass substrate. X-ray diffraction (XRD) of the films revealed wurtzite crystals that were confirmed through the analysis of high resolution transmission electron microscopy (HRTEM). With increasing the Sc-content from 0 to 2.37 wt.% in the films, the optical energy band gap (Eg) was estimated to decrease from 3.25 to 3.20 eV, and the electrical resistivity (Omega cm) decreased from 3.8 x 10(-3) to 1.3 x 10(-3). The decrease in resistivity may be ascribed to electrons tunneling through the horizontal stacking faults induced by Sc-dopants in the films. Published by Elsevier B.V.
Relation:	THIN SOLID FILMS
Appears in Collections:	[National Central University Department of Chemical & Materials Engineering] journal & Dissertation

Files in This Item:

File	Description	Size	Format
index.html		0Kb	HTML	599	View/Open

社群 sharing