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    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/27048


    Title: On the resistance of silver migration in Ag-Pd conductive thick films under humid environment and applied dc field
    Authors: Lin,JC;Chan,JY
    Contributors: 機械工程學系
    Keywords: PALLADIUM;ALLOY;SPECTROSCOPY;TECHNOLOGY;OXIDES;ESCA
    Date: 1996
    Issue Date: 2010-06-29 18:06:25 (UTC+8)
    Publisher: 中央大學
    Abstract: Silver migration occurring in pure silver conductive thick films was minimized by using Ag-Pd alloys. The in situ microscopic observation, under humid environment and an applied d.c. field, showed that the out-growth of silver dendrites from the cathode decreases with increasing (5-20%) amount of Pd in the Ag-Pd specimens, and ceases completely at 30% Pd. The enhancement of silver migration resistance with increasing Pd concentration in Ag-Pd conductors was evident by the measurements of the short circuit current between a couple of thick-him electrodes in distilled water at 5 V. Through the study of anodic potentiodynamic polarization in 0.01 M NaOH and the examination of the surface films on the thick films by X-ray diffraction and surface analyses (Auger and ESCA), it was found that the anodic formation of PdO blocks the silver dissolution, and minimizes the occurrence of silver migration.
    Relation: MATERIALS CHEMISTRY AND PHYSICS
    Appears in Collections:[機械工程研究所] 期刊論文

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