Impact of Capacitance Correlation on Yield Enhancement of Mixed-Signal/Analog Integrated Circuits

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Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/31855

Title:	Impact of Capacitance Correlation on Yield Enhancement of Mixed-Signal/Analog Integrated Circuits
Authors:	Luo,Pei-Wen;Chen,Jwu-E;Wey,Chin-Long;Cheng,Liang-Chia;Chen,Ji-Jan;Wu,Wen-Ching
Contributors:	電機工程研究所
Keywords:	CONVERTERS
Date:	2008
Issue Date:	2010-07-06 18:13:02 (UTC+8)
Publisher:	中央大學
Abstract:	Random fluctuations in process conditions change the physical properties of parameters on a chip. The correlation of device parameters depends on spatial locations. In general, the closer devices most likely have the similar parameter variation. The key p
Relation:	IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS????
Appears in Collections:	[Graduate Institute of Electrical Engineering] journal & Dissertation

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