The scanning data collection strategy for enhancing the quality of electrical impedance tomography

NCUIR > College of Electrical Engineering & Computer Science > Graduate Institute of Electrical Engineering > journal & Dissertation > Item 987654321/31913

Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/31913

Title:	The scanning data collection strategy for enhancing the quality of electrical impedance tomography
Authors:	Huang,Cheng-Ning;Yu,Fang-Ming;Chung,Hung-Yuan
Contributors:	電機工程研究所
Keywords:	RECONSTRUCTION;RESOLUTION;SYSTEM
Date:	2008
Issue Date:	2010-07-06 18:14:20 (UTC+8)
Publisher:	中央大學
Abstract:	This paper addresses a scanning data collection strategy in electrical impedance tomography (EIT) to enhance the quality of an impedance image by expanding the electrode number. This scanning EIT (SEIT) system rotates the electrode pairs at a small angle,
Relation:	IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT????
Appears in Collections:	[Graduate Institute of Electrical Engineering] journal & Dissertation

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