A multilayer data copy test data com pression scheme for reducing shifting-in power for multiple scan design

NCUIR > College of Electrical Engineering & Computer Science > Graduate Institute of Electrical Engineering > journal & Dissertation > Item 987654321/31959

Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/31959

Title:	A multilayer data copy test data com pression scheme for reducing shifting-in power for multiple scan design
Authors:	Lin,Shih-Ping;Lee,Chung-Len;Chen,Jwu-E;Chen,Ji-Jan;Luo,Kun-Lun;Wu,Wen-Ching
Contributors:	電機工程研究所
Keywords:	TEST-DATA-COMPRESSION;A-CHIP TEST
Date:	2007
Issue Date:	2010-07-06 18:15:21 (UTC+8)
Publisher:	中央大學
Abstract:	The random-like filling strategy pursuing high compression for today's popular test compression schemes introduces large test power. To achieve high compression in conjunction with reducing test power for multiple-scan-chain designs is even harder and ver
Relation:	IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
Appears in Collections:	[Graduate Institute of Electrical Engineering] journal & Dissertation

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