Raisin: Redundancy analysis algorithm simulation

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Title:	Raisin: Redundancy analysis algorithm simulation
Authors:	Huang,Rei-Fu;Li,Jin-Fu;Yeh,Jen-Chieh;Wu,Cheng-Wen
Contributors:	電機工程研究所
Keywords:	EMBEDDED-MEMORY;YIELD
Date:	2007
Issue Date:	2010-07-06 18:18:29 (UTC+8)
Publisher:	中央大學
Abstract:	To increase redundancy repair efficiency and thus final yield in embedded-memory cores, we propose Raisin, a redundancy analysis algorithm simulation tool that can calculate an RA algorithm's repair rate, yield, associated memory configuration, and redund
Relation:	IEEE DESIGN & TEST OF COMPUTERS
Appears in Collections:	[Graduate Institute of Electrical Engineering] journal & Dissertation

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