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    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/32196


    Title: Improved Schottky leakage current of In0.5Al0.5As/In0.5Ga0.5As metamorphic HEMTs using (NH4)(2)S-x treatment
    Authors: Chiu,Hsien-Chin;Chang,Liann-Be;Huang,Yuan-Chang;Chen,Chung-Wen;Li,Yu-Jen;Chan,Yi-Jen
    Contributors: 電機工程研究所
    Keywords: SULFUR PASSIVATION;HIGH-PERFORMANCE;GAAS;TRANSISTORS
    Date: 2006
    Issue Date: 2010-07-06 18:20:52 (UTC+8)
    Publisher: 中央大學
    Abstract: Surface passivation process play an important role, especially in high-power In0.5Al0.5As/In0.5Ga0.5As metamorphic high-electron-mobility transistor (MHEMT) applications, and a passivation pretreatment technology has been proposed in this study. Before th
    Relation: ELECTROCHEMICAL AND SOLID STATE LETTERS
    Appears in Collections:[Graduate Institute of Electrical Engineering] journal & Dissertation

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