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    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/32314


    Title: High-temperature high-humidity and electrical static discharge stress effects on GaN p-i-n UV sensor
    Authors: Liu,SS;Li,PW;Lan,WH;Lin,WJ
    Contributors: 電機工程研究所
    Keywords: ULTRAVIOLET DETECTORS;PHOTODIODES;PHOTODETECTORS
    Date: 2005
    Issue Date: 2010-07-06 18:23:51 (UTC+8)
    Publisher: 中央大學
    Abstract: We report the operation tests of GaN p-i-n photodetectors under the conditions of high-temperature (HT), high-temperature high-humidity (HTHH), and electrical static discharge (ESD). It is found that the ESD stress plays the dominant role for the degradat
    Relation: MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY
    Appears in Collections:[電機工程研究所] 期刊論文

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