A re-examination of the IEM model for microwave scattering from randomly rough boundary

NCU Institutional Repository > 資訊電機學院 > 電機工程研究所 > 期刊論文 > Item 987654321/32462

jsp.display-item.identifier=請使用永久網址來引用或連結此文件: http://ir.lib.ncu.edu.tw/handle/987654321/32462

题名:	A re-examination of the IEM model for microwave scattering from randomly rough boundary
作者:	Liu,WY;Chen,KS;Tsay,MK;Wu,TD
贡献者:	電機工程研究所
关键词:	SURFACE SCATTERING
日期:	2003
上传时间:	2010-07-06 18:28:40 (UTC+8)
出版者:	中央大學
摘要:	An IEM surface scattering model was examined in terms of its applicability to simulations and laboratory measurements. New expressions for both single scattering and multiple scattering were obtained by re-deriving the scattering coefficient to keep all t
關聯:	JOURNAL OF THE CHINESE INSTITUTE OF ENGINEERS
显示于类别:	[電機工程研究所] 期刊論文

文件中的档案:

档案	描述	大小	格式	浏览次数
index.html		0Kb	HTML	421	检视/开启

在NCUIR中所有的数据项都受到原著作权保护.

社群 sharing