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    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/32510

    Title: X-ray scattering studies on InGaAs quantum dots
    Authors: Hsu,CH;Lee,HY;Hsieh,YW;Stetsko,YP;Tang,MT;Liang,KS;Yeh,NT;Chyi,JI;Noh,DY
    Contributors: 電機工程研究所
    Keywords: STRAIN
    Date: 2003
    Issue Date: 2010-07-06 18:30:15 (UTC+8)
    Publisher: 中央大學
    Abstract: We present a structural investigation of self-assembled InGaAs quantum dots on GaAS(0 0 1) substrates grown by molecular-beam epitaxy. The grazing incidence X-ray scattering measurements were performed at BL17B of Taiwan Light Source and BL12B2 of SPring-
    Appears in Collections:[電機工程研究所] 期刊論文

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