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    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/32563


    Title: Scanning electron filling modulation reflectance of charged InGaAs self-assembled quantum dot
    Authors: Hsu,TM;Chang,WH;Lai,CY;Yeh,NT;Chyi,JI
    Contributors: 電機工程研究所
    Keywords: SPECTROSCOPY
    Date: 2002
    Issue Date: 2010-07-06 18:32:12 (UTC+8)
    Publisher: 中央大學
    Abstract: We present the scanning electron-filling modulation reflectance (SEFR) of charged In0.5Ga0.5As self-assembled quantum dots. The SEFR is performed by applying a small constant modulation voltage and scanning the dc bias through the quantum dot energy level
    Relation: JOURNAL OF APPLIED PHYSICS
    Appears in Collections:[Graduate Institute of Electrical Engineering] journal & Dissertation

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