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    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/32601


    Title: Fault diagnosis for linear analog circuits
    Authors: Lin,JW;Lee,CL;Su,CC;Chen,JE
    Contributors: 電機工程研究所
    Date: 2001
    Issue Date: 2010-07-06 18:33:37 (UTC+8)
    Publisher: 中央大學
    Abstract: This paper presents a novel scheme to diagnose single and double faults for linear analog circuits. The scheme first proposes a simple transformation procedure to transform the tested linear analog circuit into a discrete signal flow graph, then construct
    Relation: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
    Appears in Collections:[電機工程研究所] 期刊論文

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