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    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/35432


    Title: Investigation of degradation for ohmic performance of oxidized Au/Ni/Mg-doped GaN
    Authors: Lin,YJ;Li,ZD;Hsu,CW;Chien,FT;Lee,CT;Shao,ST;Chang,HC
    Contributors: 光電科學與工程學系
    Keywords: P-TYPE GAN;CONTACTS
    Date: 2003
    Issue Date: 2010-07-07 14:14:39 (UTC+8)
    Publisher: 中央大學
    Abstract: The mechanism of ohmic contact degradation for the oxidized Au/Ni/Mg-doped GaN under various annealing times has been investigated. According to the results from x-ray photoelectron spectroscopy and the Cserveny's concept, we found that an increase of hol
    Relation: APPLIED PHYSICS LETTERS
    Appears in Collections:[光電科學與工程學系] 期刊論文

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