English  |  正體中文  |  简体中文  |  Items with full text/Total items : 66984/66984 (100%)
Visitors : 23027317      Online Users : 397
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version


    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/35655


    Title: Multilayer coatings monitoring using admittance diagram
    Authors: Lee,Cheng-Chung;Chen,Yu-Jen
    Contributors: 薄膜技術研究中心
    Keywords: OPTICAL COATINGS;ELLIPSOMETRY;FILTERS
    Date: 2008
    Issue Date: 2010-07-07 15:47:11 (UTC+8)
    Publisher: 中央大學
    Abstract: A method based on admittance diagram called Admittance Realtime Monitoring, ARM, was proposed to monitor multilayer coatings. This optical monitoring method is highly sensitive and capable to compensate for thickness errors. The sensitivities of ARM were
    Relation: OPTICS EXPRESS
    Appears in Collections:[薄膜技術研究中心] 期刊論文

    Files in This Item:

    File Description SizeFormat
    index.html0KbHTML1075View/Open


    All items in NCUIR are protected by copyright, with all rights reserved.

    社群 sharing

    ::: Copyright National Central University. | 國立中央大學圖書館版權所有 | 收藏本站 | 設為首頁 | 最佳瀏覽畫面: 1024*768 | 建站日期:8-24-2009 :::
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback  - 隱私權政策聲明