中大機構典藏-NCU Institutional Repository-提供博碩士論文、考古題、期刊論文、研究計畫等下載:Item 987654321/51674
English  |  正體中文  |  简体中文  |  Items with full text/Total items : 80990/80990 (100%)
Visitors : 41645304      Online Users : 1335
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version


    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/51674


    Title: An approach to the R&D value based upon real option method
    Authors: Lo,KH;Lan,YW
    Contributors: 企業管理學系
    Keywords: DEVELOPMENT EXPENDITURES;VALUATION;AMORTIZATION;INFORMATION;RETURNS;STOCK;MODEL;RISK
    Date: 2010
    Issue Date: 2012-03-27 19:02:31 (UTC+8)
    Publisher: 國立中央大學
    Abstract: This paper aims to build up feasible models based upon the real option method (ROM) to assess R&D. In this paper we built eight models integrating with three conditions to assimilate the real situation an R&D project may encounter. We utilized both numerical and statistical illustration based upon an empirical case to exhibit the correctness of our models. We diverged our discussion into either expense or capital viewpoint to react with current accounting debate. The results shed us the light: our models in both expense and capital viewpoint can correctly asses R & D; the selected conditions play essential roles to influence the correctness of our models.
    Relation: QUALITY & QUANTITY
    Appears in Collections:[Department of Business Administration ] journal & Dissertation

    Files in This Item:

    File Description SizeFormat
    index.html0KbHTML431View/Open


    All items in NCUIR are protected by copyright, with all rights reserved.

    社群 sharing

    ::: Copyright National Central University. | 國立中央大學圖書館版權所有 | 收藏本站 | 設為首頁 | 最佳瀏覽畫面: 1024*768 | 建站日期:8-24-2009 :::
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 隱私權政策聲明