運用角解析光電子能譜術來檢測與操控奈米結構的性質;Properties of Nanostructures Characterized and Manipulated with Angular-Resolved Photoelectron Spectroscopy

Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/62741

Title:	運用角解析光電子能譜術來檢測與操控奈米結構的性質;Properties of Nanostructures Characterized and Manipulated with Angular-Resolved Photoelectron Spectroscopy
Authors:	陸大安
Contributors:	國立中央大學物理學系
Keywords:	物理
Date:	2012-12-01
Issue Date:	2014-03-17 12:01:48 (UTC+8)
Publisher:	行政院國家科學委員會
Abstract:	研究期間：10108~10207;How a nanostructure behaves is closely related to its electronic structure. One can modify the electronic structure of a nanostructure by varying its physical dimensions and surface composition. Therefore, to construct, characterize, and manipulate a nanostructure properly, it is crucial to measure its electronic structure accurately. The angle-resolved photoelectron spectroscopy (ARPES) is one of the best tools to determine the electronic state of material. Our research proposal is aimed to construct an endstation that can be installed on different beamlines at NSSRC to perform ARPES measurements. After the execution of our proposal, we expect to gain great capability to characterize many advanced nanostructures and insight into the dynamics on the surface of nanostructures. This ability will be the key to construct novel nanometer-size devices. We also believe that the proposed ARPES system will be a great complement to the scanning probe microscopy widely adapted in surface studies in Taiwan.
Relation:	財團法人國家實驗研究院科技政策研究與資訊中心
Appears in Collections:	[Department of Physics] Research Project

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