運用角解析光電子能譜術來檢測與操控奈米結構的性質;Properties of Nanostructures Characterized and Manipulated with Angular-Resolved Photoelectron Spectroscopy

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題名:	運用角解析光電子能譜術來檢測與操控奈米結構的性質;Properties of Nanostructures Characterized and Manipulated with Angular-Resolved Photoelectron Spectroscopy
作者:	陸大安
貢獻者:	國立中央大學物理學系
關鍵詞:	物理
日期:	2012-12-01
上傳時間:	2014-03-17 12:01:48 (UTC+8)
出版者:	行政院國家科學委員會
摘要:	研究期間：10108~10207;How a nanostructure behaves is closely related to its electronic structure. One can modify the electronic structure of a nanostructure by varying its physical dimensions and surface composition. Therefore, to construct, characterize, and manipulate a nanostructure properly, it is crucial to measure its electronic structure accurately. The angle-resolved photoelectron spectroscopy (ARPES) is one of the best tools to determine the electronic state of material. Our research proposal is aimed to construct an endstation that can be installed on different beamlines at NSSRC to perform ARPES measurements. After the execution of our proposal, we expect to gain great capability to characterize many advanced nanostructures and insight into the dynamics on the surface of nanostructures. This ability will be the key to construct novel nanometer-size devices. We also believe that the proposed ARPES system will be a great complement to the scanning probe microscopy widely adapted in surface studies in Taiwan.
關聯:	財團法人國家實驗研究院科技政策研究與資訊中心
顯示於類別:	[物理學系] 研究計畫

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