以電漿子增強螢光顯微術結合反摺積描繪金屬奈米結構;Mapping of Metallic Nanostructures by Plasmon Enhanced Fluorescence Microscopy in Combination of Deconvolution Method

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題名:	以電漿子增強螢光顯微術結合反摺積描繪金屬奈米結構;Mapping of Metallic Nanostructures by Plasmon Enhanced Fluorescence Microscopy in Combination of Deconvolution Method
作者:	洪毓瑄;Hung, Yu-Hsuan
貢獻者:	光電科學與工程學系
關鍵詞:	螢光顯微術;反摺積;金屬奈米結構;Fluorescence Microscopy;Deconvolution;Metallic Nanostructures
日期:	2017-07-25
上傳時間:	2017-10-27 17:18:06 (UTC+8)
出版者:	國立中央大學
摘要:	本論文利用反摺積技術重建R6G螢光分子在金屬奈米結構上隨機發光的過程，以獲得一張超解析影像。透過金屬電漿子增強螢光訊號強度，來凸顯金屬與基板訊號上的差異，再控制螢光分子濃度使之稀疏發光，進而達到單分子發光，由於布朗運動的關係，螢光分子會隨機出現在樣品上，錄製每個時刻的螢光影像，再透過反摺積運算，疊加一張張反摺積後的螢光影像，便能描繪出金屬奈米結構。若能成功達到與電子顯微鏡相同解析度，便是建立了一項超解析影像技術，此技術將超越光學顯微鏡的解析度，且不具有像電子顯微鏡有破壞樣品的風險。;This research by using the method of deconvolution rebuild the process of random blinking caused by Rhodamine 6G on nanoscale metal structures, obtaining a super resolution image as result. In order to enhance the S/N ratio between nanoscale metal structures and substrates, we take advantage of surface plasmons to rise the intensity of fluorescence on nanoscale metal structures. Further, by adjusting the concentration of Rhodamine 6G solution to achieve the goal of single molecular blinking. By Brownian motion theory, Rhodamine 6G molecules would appear on sample randomly. With the films and images of fluorescence taking place on nanoscale metal structures, we could rebuild the morphology of nanoscale metal structures through deconvolution calculations. If the resolution of the final result reach the same level as SEM, it can be seen as a super resolution technique. This technique could provide higher resolution images than conventional optical microscopes, also could avoid the risk of destroying samples by using SEM.
顯示於類別:	[光電科學研究所] 博碩士論文

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