English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 80990/80990 (100%)
造訪人次 : 41631791      線上人數 : 3984
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋


    請使用永久網址來引用或連結此文件: http://ir.lib.ncu.edu.tw/handle/987654321/80237


    題名: 半導體製程可靠度之研究
    作者: 黃翔暐;Huang, Hsiang-Wei
    貢獻者: 工業管理研究所
    關鍵詞: 半導體製程;預診斷與運行狀況管理;過程失效模式與效應分析;故障樹分析;Semiconductor process;Prognostic and Health Management;Process Failure Mode and Effects Analysis;Fault Tree Analysis
    日期: 2019-07-26
    上傳時間: 2019-09-03 12:24:32 (UTC+8)
    出版者: 國立中央大學
    摘要: 台灣的半導體產業發展至今已有近四十年的歷史,製程與產業結構鏈已經相當的完整與成熟。由於半導體產業鏈非常的複雜,並且環環相扣,若在過程中任何一個步驟出現錯誤,將對整體造成生產週期增加與產線停滯等嚴重後果。隨著預診斷及運行狀況管理(Prognostics and Health Management)的應用逐漸普及,本研究也沿用此方法的概念來進行改善。
    本研究針對半導體產業鏈的關鍵問題找出預防及改善的方法,應用製程失效模式與影響分析(Process Failure Mode and Effect Analysis, PFMEA)分析潛在失效模式,透過風險優先數值(Risk Priority Number, RPN)找出高風險的問題,並結合故障樹分析(Fault tree analysis, FTA),區分出造成影響的嚴重性,在還沒發生故障前,擬定適當的製程改善對策及措施,降低可能造成的風險並提升製程、設備之可靠性。
    ;Taiwan′s semiconductor industry has developed for about 40 years. The process and industrial structure chain has been quite complete and mature. Because the semiconductor process is very complicated and interlocking, if some mistakes occur in any step of the process, the overall production cycle will increase and the production line will be stagnant. As the application of Prognostics and Health Management has become popular. This study has also used the concept of this technology to improve the problem.
    This study identifies prevention and improvement methods for key issues in semiconductor processes. Applies process failure mode and effect analysis (PFMEA) to analyze potential failure modes and find out the high-risk problem through Risk Priority Number (RPN), and combined with the Fault Tree Analysis (FTA). Distinguish the severity of the impact, and formulate appropriate process improvement strategy and measures before the failure has occurred. Reduce the possible risks and improve the reliability of the process and equipment.
    顯示於類別:[工業管理研究所 ] 博碩士論文

    文件中的檔案:

    檔案 描述 大小格式瀏覽次數
    index.html0KbHTML224檢視/開啟


    在NCUIR中所有的資料項目都受到原著作權保護.

    社群 sharing

    ::: Copyright National Central University. | 國立中央大學圖書館版權所有 | 收藏本站 | 設為首頁 | 最佳瀏覽畫面: 1024*768 | 建站日期:8-24-2009 :::
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 隱私權政策聲明