English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 80990/80990 (100%)
造訪人次 : 41632762      線上人數 : 3731
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋


    請使用永久網址來引用或連結此文件: http://ir.lib.ncu.edu.tw/handle/987654321/88532


    題名: 以用途理論探討SLT產品定位之研究
    作者: 陳樹德;Chen, Shu-De
    貢獻者: 高階主管企管碩士班
    關鍵詞: 用途理論(JTBD);系統級測試(SLT);需求任務;Jobs To Be Done;System Level Test;Need
    日期: 2022-06-10
    上傳時間: 2022-07-14 13:52:47 (UTC+8)
    出版者: 國立中央大學
    摘要: 社會生活發展至今,人們現代的生活已無時不刻依賴電子設備與其生產製造的產品。實現滿足人們社會生活中的: 生理需求、安全需求、社交需求、自尊需求、自我實現 (馬斯洛的五大需求層次)。在電子產業不斷快速發展的需求帶動下,大量產品需求因應而生。電子產品從設計、生產製造都將透過各種量測、檢驗的儀器設備或是軟體來保障產品的功能性與品質安全。且因產品、技術,持續的演進帶來相關測試設備的需求蓬勃發展,較高的行業利潤與商機,自然引來眾多的需求者與競爭者同時在尋找發展機會。
    系統級測試 (System Level Test; 簡稱SLT),亦可稱為功能性測試。不同於一般半導體晶片的電性測試方案,而是在終端產品的實際功能性測試需求下,SLT產品為整合自動化與量測所發展出的客製化設備,由於客製化設備普遍存在少量多樣的特徵,對於不同客戶及其關係人的想法,往往需求較不易卻必須達到一定程度的共識,才能讓達成設備達成銷售及完成其功能及價值。本研究以用途理論 (Jobs To Be Done) 探討SLT產品之定位。經透過市場資訊與次級資料分析,各類型電子產品的功能性測試需求,會因各類型產品的特性不同,存在較大變異性,故SLT產品不利於開發商以市場量化及標準化模式發展,SLT產品的價格與利潤也較優於一般傳統測試,在相關因素的驅使下更多的競爭者加入市場競爭。
    本研究以JTBD 來分析使用者與其關係人所各自扮演的角色,從不同用戶的需求任務 : 功能性、情感性、社會性,來解釋說明SLT產品之定位。現有產品的價值與發展方向,不再侷限於開發出完美與極致的產品,以用戶的真實需求來呈現產品的獨特性以及其附加價值。;The development of social life so fa,People′s modern life has always depended on electronic equipment and the products they produce.Realize the satisfaction of people′s social life:physiological needs、Security Needs、Affiliation Needs、Esteem Needs、Self-actualisation Needs(Maslow′s hierarchy of needs). Driven by the demand of the continuous and rapid development of the electronic industry, a large number of products meet the demand. In the process from product design to manufacturing, all kinds of electronic products will ensure the functionality, quality and safety of products through measuring and testing instruments and equipment or software. Due to the continuous evolution of products and technologies, the demand for relevant test equipment is booming, and the high industry profits and business opportunities naturally attract many demanders and competitors looking for development opportunities at the same time.

    System and test (System Level Test referred to as SLT), is also called functional test. Different from the electrical test scheme of general semiconductor chips, but under the actual functional test requirements of terminal products, SLT products are customized equipment developed for the integration of automation and measurement. Due to the small and diverse characteristics of customized equipment, it is often difficult to meet the needs of different customers and their relations, but it must reach a certain degree of consensus, In order to make the equipment sell, that is, to complete its function and value. This study uses( Jobs To Be Done) to explore the positioning of SLT products. Through the analysis of market information and secondary data, the functional test requirements of various types of electronic products will have great variability due to the different characteristics of various types of products. Therefore, SLT products are unfavorable for developers to develop in the market quantification and standardization mode. The price and profit of SLT products are also better than the general traditional test. Driven by relevant factors, more competitors join the market competition.

    This study uses JTBD to analyze the roles played by users and their relationships, and explains the positioning of SLT products from the needs and tasks of different users: functionality, emotion and sociality. The value and development direction of existing products are no longer limited to developing perfect and ultimate products, and presenting the uniqueness and added value of products with the real needs of users.
    顯示於類別:[高階主管企管(EMBA)碩士班] 博碩士論文

    文件中的檔案:

    檔案 描述 大小格式瀏覽次數
    index.html0KbHTML51檢視/開啟


    在NCUIR中所有的資料項目都受到原著作權保護.

    社群 sharing

    ::: Copyright National Central University. | 國立中央大學圖書館版權所有 | 收藏本站 | 設為首頁 | 最佳瀏覽畫面: 1024*768 | 建站日期:8-24-2009 :::
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 隱私權政策聲明